No. |
Part Name |
Description |
Manufacturer |
1381 |
MN6201 |
V(dd): -0.2 to +3.0V; CMOS quartz watch circuit. For LCD driver |
Panasonic |
1382 |
MN6220 |
V(dd): -0.3 to +4.0V; V(in): -0.3 to +0.3V; CMOS quartz clock circuit with time signal generator |
Panasonic |
1383 |
MNDS26F32M-X-RH |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1384 |
MNDS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1385 |
MNDS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1386 |
MNDS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1387 |
MNDS26F32MJ/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1388 |
MNDS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1389 |
MNDS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1390 |
MNDS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1391 |
MNDS26F32MW/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1392 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1393 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1394 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1395 |
MNDS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
1396 |
MNLM136A |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
1397 |
MNLM136A-2.5-X |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
1398 |
MNLM136A-2.5-X-RH |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
1399 |
MNLMH6628-X-RH |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1400 |
MP1342 |
1/2 inche photoncounting module. Window material quartz. Dark counts per second 40 cps. |
PerkinElmer Optoelectronics |
1401 |
MP1352 |
1/2 inche photoncounting module. Window material quartz. Dark counts per second 160 cps. |
PerkinElmer Optoelectronics |
1402 |
MP1362 |
1/2 inche photoncounting module. Window material quartz. Dark counts per second 400 cps. |
PerkinElmer Optoelectronics |
1403 |
MP1372 |
1/2 inche photoncounting module. Window material quartz. Dark counts per second 2000 cps. |
PerkinElmer Optoelectronics |
1404 |
MP1382 |
1/2 inche photoncounting module. Window material quartz. Dark counts per second 10 cps. |
PerkinElmer Optoelectronics |
1405 |
MP1942 |
3/4 inche photoncounting module. Window material quartz. Dark counts per second 100 cps. |
PerkinElmer Optoelectronics |
1406 |
MP1952 |
3/4 inche photoncounting module. Window material quartz. Dark counts per second 400 cps. |
PerkinElmer Optoelectronics |
1407 |
MP1962 |
3/4 inche photoncounting module. Window material quartz. Dark counts per second 1000 cps. |
PerkinElmer Optoelectronics |
1408 |
MP1972 |
3/4 inche photoncounting module. Window material quartz. Dark counts per second 5000 cps. |
PerkinElmer Optoelectronics |
1409 |
MP1982 |
3/4 inche photoncounting module. Window material quartz. Dark counts per second 25 cps. |
PerkinElmer Optoelectronics |
1410 |
MP972 |
1/3 inche photoncounting module. Window material quartz. Dark counts per second 500 cps. |
PerkinElmer Optoelectronics |
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