| No. |
Part Name |
Description |
Manufacturer |
| 13891 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 13892 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 13893 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 13894 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 13895 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 13896 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 13897 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 13898 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 13899 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 13900 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 13901 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 13902 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 13903 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 13904 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 13905 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 13906 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 13907 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 13908 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 13909 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 13910 |
SN74S482 |
4-Bit-Slice Expandable Control Elements 20-PDIP 0 to 70 |
Texas Instruments |
| 13911 |
SN74S482N |
4-Bit-Slice Expandable Control Elements 20-PDIP 0 to 70 |
Texas Instruments |
| 13912 |
SNC710 |
16-bit Voice Engine |
SONiX Technology Company |
| 13913 |
SNC725 |
16-bit Voice Processor |
SONiX Technology Company |
| 13914 |
SNC735 |
16-bit Voice Processor |
SONiX Technology Company |
| 13915 |
SNC745 |
16-bit Voice Processor |
SONiX Technology Company |
| 13916 |
SNJ54ABT18245WD |
Scan Test Device With 18-Bit Bus Transceivers 56-CFP -55 to 125 |
Texas Instruments |
| 13917 |
SNJ54ABT18502HV |
Scan Test Device With 18-Bit Registered Bus Transceiver |
Texas Instruments |
| 13918 |
SSI73D2240 |
V.22bis 2400 Bit/s Modem Device Set |
Silicon Systems |
| 13919 |
SSI73D2248 |
MNP5, V.42bis Datacom Modem Device Set |
Silicon Systems |
| 13920 |
SSI73D2348 |
MNP5, V.42bis Datacom Modem Device Set |
Silicon Systems |
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