| No. |
Part Name |
Description |
Manufacturer |
| 151 |
F2224-29S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 152 |
F2224-31 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 153 |
F2224-31M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 154 |
F2224-31P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 155 |
F2224-31S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 156 |
F2224-34 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 157 |
F2224-34M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 158 |
F2224-34P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 159 |
F2224-34S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 160 |
F2224-39 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 161 |
F2224-39M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 162 |
F2224-39P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 163 |
F2224-39S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 164 |
HD703M |
MOS - 4-bit Dynamic Memory |
Hitachi Semiconductor |
| 165 |
HMC283 |
GaAs MMIC MEDIUM POWER AMPLIFIER, 17 - 40 GHz |
Hittite Microwave Corporation |
| 166 |
HMC441 |
GaAs PHEMT MMIC MEDIUM POWER AMPLIFIER, 6.0 - 18.0 GHz |
Hittite Microwave Corporation |
| 167 |
HMC441LC3B |
GaAs PHEMT MMIC MEDIUM POWER AMPLIFIER, 6 - 18 GHz |
Hittite Microwave Corporation |
| 168 |
HMC441LM1 |
GaAs PHEMT MMIC MEDIUM POWER AMPLIFIER, 7.0 - 15.5 GHz |
Hittite Microwave Corporation |
| 169 |
HMC441LP3 |
GaAs PHEMT MMIC MEDIUM POWER AMPLIFIER, 6.5 - 13.5 GHz |
Hittite Microwave Corporation |
| 170 |
HMC442 |
GaAs PHEMT MMIC MEDIUM POWER AMPLIFIER, 17.5 - 25.5 GHz |
Hittite Microwave Corporation |
| 171 |
HMC442LM1 |
GaAs PHEMT MMIC MEDIUM POWER AMPLIFIER, 17.5 - 24 GHz |
Hittite Microwave Corporation |
| 172 |
HMC499 |
GaAs PHEMT MMIC MEDIUM POWER AMPLIFIER, 21 - 32 GHz |
Hittite Microwave Corporation |
| 173 |
ICM102A |
3.3 V, CIF CMOS image sensor |
IC MEDIA |
| 174 |
ICM202BS |
CIF/QCIF CMOS image sensor with digital YUV output |
IC MEDIA |
| 175 |
ICM202BT |
CIF/QCIF CMOS image sensor with digital YUV output |
IC MEDIA |
| 176 |
ICM515NB |
Color CMOS image sensor 3.3 V |
IC MEDIA |
| 177 |
LC7151 |
C MOS Si Gate IC Meeting FCC 10-Channel Standard PLL for Cordless Telephone |
SANYO |
| 178 |
MAX9949 |
Dual Per-Pin Parametric Measurement Units |
MAXIM - Dallas Semiconductor |
| 179 |
MAX9949DCCB+D |
Dual Per-Pin Parametric Measurement Units |
MAXIM - Dallas Semiconductor |
| 180 |
MAX9949DCCB+TD |
Dual Per-Pin Parametric Measurement Units |
MAXIM - Dallas Semiconductor |
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