No. |
Part Name |
Description |
Manufacturer |
151 |
5962-9172501MLA |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
152 |
5962-9172601M3A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
153 |
5962-9172601MLA |
Scan Test Devices With Octal Buffers |
Texas Instruments |
154 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
155 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
156 |
5962-9172801Q3A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
157 |
5962-9172801QLA |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
158 |
5962-9174601Q3A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
159 |
5962-9174601QLA |
Scan Test Devices With Octal Buffers |
Texas Instruments |
160 |
5962-9318601M3A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
161 |
5962-9318601MLA |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
162 |
5962-9323901Q3A |
Scan Path Linkers With 4-Bit Identification Buses |
Texas Instruments |
163 |
5962-9323901QXA |
Scan Path Linkers With 4-Bit Identification Buses |
Texas Instruments |
164 |
5962-9458601Q3A |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
165 |
5962-9458601QXA |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
166 |
5962-9460102QXA |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
167 |
5962-9461501Q3A |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
168 |
5962-9461501QXA |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
169 |
5962-9461601Q3A |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
170 |
5962-9461601QXA |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
171 |
5962-9467201QXA |
Scan Test Device With 18-Bit Registered Bus Transceiver |
Texas Instruments |
172 |
5962-9469801QXA |
Scan Test Devices With 18-Bit Bus Transceivers And Registers |
Texas Instruments |
173 |
5962-9475001Q3A |
Embedded Boundary Scan Controller |
National Semiconductor |
174 |
5962-9475001QXA |
Embedded Boundary Scan Controller |
National Semiconductor |
175 |
5962-9475001QYA |
Embedded Boundary Scan Controller |
National Semiconductor |
176 |
5962-9561401QXA |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
177 |
5962-9669801QXA |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
178 |
5962-9681101QXA |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
179 |
5962-9681201Q3A |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
180 |
5962-9681201QKA |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
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