No. |
Part Name |
Description |
Manufacturer |
151 |
SN54ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
152 |
SN54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
153 |
SN54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
154 |
SN54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP |
Texas Instruments |
155 |
SNJ54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
156 |
SNJ54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
157 |
SNJ54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
158 |
STA400EP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
159 |
STA400MTEP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
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