No. |
Part Name |
Description |
Manufacturer |
151 |
CY23FP12OXC |
200-MHz Field Programmable Zero Delay Buffer |
Cypress |
152 |
CY23FP12OXCT |
200-MHz Field Programmable Zero Delay Buffer |
Cypress |
153 |
CY23FP12OXI |
200-MHz Field Programmable Zero Delay Buffer |
Cypress |
154 |
CY23FP12OXIT |
200-MHz Field Programmable Zero Delay Buffer |
Cypress |
155 |
CY3692 |
200-MHz Field Programmable Zero Delay Buffer |
Cypress |
156 |
DFP14 |
Military, Hot Solder Dip or Gold Plated Leads, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
157 |
DFP16 |
Military, Hot Solder Dip or Gold Plated Leads, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
158 |
DNP015 |
Green Mode Fairchild Power Switch (FPSTM |
Fairchild Semiconductor |
159 |
DS022-1 |
Virte -E 1.8 V Field Programmable Gate Arrays |
Xilinx |
160 |
DS1404 |
Touch and Hold Probe Cable Cradle |
MAXIM - Dallas Semiconductor |
161 |
DS1404+ |
Touch and Hold Probe Cable Cradle |
MAXIM - Dallas Semiconductor |
162 |
DS9100 |
Touch and Hold Probe Stampings |
MAXIM - Dallas Semiconductor |
163 |
DS9100-A+ |
Touch and Hold Probe Stampings |
MAXIM - Dallas Semiconductor |
164 |
DS9100-B+ |
Touch and Hold Probe Stampings |
MAXIM - Dallas Semiconductor |
165 |
DS9100-C+ |
Touch and Hold Probe Stampings |
MAXIM - Dallas Semiconductor |
166 |
DS9100A |
Touch and Hold Probe Stampings |
MAXIM - Dallas Semiconductor |
167 |
DS9100B |
Touch and Hold Probe Stampings |
MAXIM - Dallas Semiconductor |
168 |
DS9100C |
Touch and Hold Probe Stampings |
MAXIM - Dallas Semiconductor |
169 |
EB4 |
Dual Readout, Standard and Right Angle Terminals, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
170 |
EB6 |
Dual Readout, Standard and Right Angle Terminals, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
171 |
EB7D |
Dual Readout, Selective Gold Plating, Polarization Between Contact Positions, Polarizing Key is Reinforced Nylon, Protected Entry |
Vishay |
172 |
EB7S |
Single Readout, Selective Gold Plating, Polarization Between Contact Positions, Polarizing Key is Reinforced Nylon, Protected Entry |
Vishay |
173 |
EB8 |
Dual Readout, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
174 |
FA22e |
Field probe |
Siemens |
175 |
FA24 |
Field Probe |
Siemens |
176 |
FC32 |
Magnetic Field Probe |
Siemens |
177 |
FC33 |
Magnetic Field Probe |
Siemens |
178 |
FMC2 |
Epitaxial Planar Dual Mini-Mold PNP/NPN Silicon Transistor |
ROHM |
179 |
FP15M20 |
Field Plates |
Siemens |
180 |
FP17L100 |
Field Plates |
Siemens |
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