| No. |
Part Name |
Description |
Manufacturer |
| 1771 |
SN54LVT8996JT |
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
Texas Instruments |
| 1772 |
SN74ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 1773 |
SN74ABT8996DW |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 1774 |
SN74ABT8996DWR |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 1775 |
SN74ABT8996PW |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 1776 |
SN74ABT8996PWLE |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 1777 |
SN74ABT8996PWR |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 1778 |
SN74ACT8990 |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
| 1779 |
SN74ACT8990FN |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
| 1780 |
SN74ACT8990FNR |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
| 1781 |
SN74ACT8994 |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
| 1782 |
SN74ACT8994FN |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
| 1783 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 1784 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 1785 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 1786 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 1787 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 1788 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 1789 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 1790 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 1791 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 1792 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 1793 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 1794 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 1795 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 1796 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 1797 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 1798 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 1799 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 1800 |
SN74LVCZ161284A |
19-Bit IEEE 1284 Std Bus Interface |
Texas Instruments |
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