| No. |
Part Name |
Description |
Manufacturer |
| 1801 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
| 1802 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 1803 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 1804 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 1805 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 1806 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 1807 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 1808 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 1809 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 1810 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 1811 |
SCANPSC110 |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
| 1812 |
SCANPSC110F |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
Fairchild Semiconductor |
| 1813 |
SCANPSC110FFMQB |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
| 1814 |
SCANPSC110FLMQB |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
| 1815 |
SCANSTA101 |
Low Voltage IEEE 1149.1 System Test Access (STA) Master |
Texas Instruments |
| 1816 |
SCANSTA101SM |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 1817 |
SCANSTA101SM/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 1818 |
SCANSTA101SMX |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 1819 |
SCANSTA101SMX/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 1820 |
SCHEMATICS |
AMD Test Interface Port Board Schematics |
Advanced Micro Devices |
| 1821 |
SMAJ100 |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 100 V. Test current IT = 1 mA. |
Bytes |
| 1822 |
SMAJ100A |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 100 V. Test current IT = 1 mA. |
Bytes |
| 1823 |
SMAJ100C |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 100 V. Test current IT = 1 mA. |
Bytes |
| 1824 |
SMAJ100CA |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 100 V. Test current IT = 1 mA. |
Bytes |
| 1825 |
SMAJ110 |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 110 V. Test current IT = 1 mA. |
Bytes |
| 1826 |
SMAJ110A |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 110 V. Test current IT = 1 mA. |
Bytes |
| 1827 |
SMAJ110C |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 110 V. Test current IT = 1 mA. |
Bytes |
| 1828 |
SMAJ110CA |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 110 V. Test current IT = 1 mA. |
Bytes |
| 1829 |
SMAJ120 |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 120 V. Test current IT = 1 mA. |
Bytes |
| 1830 |
SMAJ120A |
Surface mount transient voltage suppressor. Reverse stand-off voltage VRWM = 120 V. Test current IT = 1 mA. |
Bytes |
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