| No. |
Part Name |
Description |
Manufacturer |
| 1801 |
P2038-03 |
PbSe photoconductive detector |
Hamamatsu Corporation |
| 1802 |
P2532-01 |
PbS photoconductive detector |
Hamamatsu Corporation |
| 1803 |
P2680-02 |
PbSe photoconductive detector |
Hamamatsu Corporation |
| 1804 |
P2680-03 |
PbSe photoconductive detector |
Hamamatsu Corporation |
| 1805 |
P2682-01 |
PbS photoconductive detector |
Hamamatsu Corporation |
| 1806 |
P2748 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1807 |
P2748-40 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1808 |
P2748-41 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1809 |
P2748-42 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1810 |
P2750 |
0.2mW; allowable current:6mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 1811 |
P2750-06 |
0.2mW; allowable current:3mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 1812 |
P2750-08 |
0.2mW; allowable current:6mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 1813 |
P3207-05 |
PbSe photoconductive detector |
Hamamatsu Corporation |
| 1814 |
P3257 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1815 |
P3257-01 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1816 |
P3257-10 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1817 |
P3257-25 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1818 |
P3257-30 |
0.2mW; allowable current:50mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 1819 |
P3257-31 |
0.2mW; allowable current:50mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 1820 |
P3257-50 |
Allowable current:40mA; MCT photoconductive detector: dewar type detector with high sensitivity and high-speed response in long wavelength range |
Hamamatsu Corporation |
| 1821 |
P368 |
CdS photoconductive cell |
Hamamatsu Corporation |
| 1822 |
P380 |
CdS photoconductive cell |
Hamamatsu Corporation |
| 1823 |
P380-7R |
CbS photoconductive cell |
Hamamatsu Corporation |
| 1824 |
P3872 |
CdS photoconductive cell |
Hamamatsu Corporation |
| 1825 |
P3981 |
0.2mW; allowable current:3mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 1826 |
P3981-01 |
0.2mW; allowable current:3mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 1827 |
P3MXP1039PC-V |
Photoconductive Detectors |
Microsemi |
| 1828 |
P4249-08 |
MCT photoconductive detector |
Hamamatsu Corporation |
| 1829 |
P467 |
CdS photoconductive cell |
Hamamatsu Corporation |
| 1830 |
P5274 |
MCT photoconductive detector |
Hamamatsu Corporation |
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