| No. |
Part Name |
Description |
Manufacturer |
| 181 |
54QHSCT630FD |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 182 |
54QHSCT630FE |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 183 |
54QHSCT630FL |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 184 |
54QHSCT630FS |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 185 |
54RHSCT630CB |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 186 |
54RHSCT630CC |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 187 |
54RHSCT630CD |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 188 |
54RHSCT630CE |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 189 |
54RHSCT630CL |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 190 |
54RHSCT630CS |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 191 |
54RHSCT630FB |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 192 |
54RHSCT630FC |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 193 |
54RHSCT630FD |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 194 |
54RHSCT630FE |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 195 |
54RHSCT630FL |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 196 |
54RHSCT630FS |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 197 |
5962F9671101VXC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 198 |
5962F9671101VYC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 199 |
5962F9672101VXC |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 200 |
5962F9672101VYC |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 201 |
61SV |
Infrared detector |
mble |
| 202 |
61SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 203 |
61SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 204 |
62SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 205 |
62SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 206 |
7109 |
Thermople Detectors for Rediation Measurements form UC to FAR IR |
Oriel |
| 207 |
7429 |
VOLTAGE DETECTOR |
Korea Electronics (KEC) |
| 208 |
74HC7046A |
Phase-locked-loop with lock detector |
Philips |
| 209 |
74HC7046AD |
Phase-locked-loop with lock detector |
NXP Semiconductors |
| 210 |
74HC7046AD |
74HC/HCT7046A; Phase-locked-loop with lock detector |
Philips |
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