| No. |
Part Name |
Description |
Manufacturer |
| 181 |
CS5501-CP |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 182 |
CS5501-SD |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 183 |
CS5501-TD |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 184 |
CS5501/03 |
Non-Aliasing, 16-Bit/20-Bit Measurement A/D Converters |
Cirrus Logic |
| 185 |
CS5503-AP |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 186 |
CS5503-AS |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 187 |
CS5503-BP |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 188 |
CS5503-BS |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 189 |
CS5503-CP |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 190 |
CS5503-SD |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 191 |
CS5503-TD |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 192 |
DN |
NTC Thermistors, Applications Include: Temperature Measurement, Temperature Control, Inrush Current Limiting, Temperature Compensation, Sensing Liquid Level or Air Flow |
Vishay |
| 193 |
EA218 |
Hall-effect devices for measuring AC und DC magnetic fields |
Siemens |
| 194 |
EB38 |
Application Note - measuring the intermodulation distorsion of linear amplifiers |
Motorola |
| 195 |
EMC1701-2 |
Current And Power Measurement ICs |
Microchip |
| 196 |
EMC1701-2-AIZL-TR |
Current And Power Measurement ICs |
Microchip |
| 197 |
EMC1704-2 |
Current And Power Measurement ICs |
Microchip |
| 198 |
EMC1704-2-AP-TR |
Current And Power Measurement ICs |
Microchip |
| 199 |
EVAL-AD5520EB |
Per-pin Parametric Measurement Unit / Source Measure Unit |
Analog Devices |
| 200 |
EVAL-AD5520EB |
Per-pin Parametric Measurement Unit / Source Measure Unit |
Analog Devices |
| 201 |
F2224-11 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 202 |
F2224-11M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 203 |
F2224-11P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 204 |
F2224-11S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 205 |
F2224-14 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 206 |
F2224-14M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 207 |
F2224-14P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 208 |
F2224-14S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 209 |
F2224-19 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 210 |
F2224-19M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
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