No. |
Part Name |
Description |
Manufacturer |
181 |
5962-9172201MFA |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
182 |
5962-9172201MFA(54ACT161FMQB) |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
183 |
5962-9172201MFA(54ACT161FMQB) |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
184 |
5962-9172201MFA(54ACT161FMQB) |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
185 |
5962-9172301M2A |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
186 |
5962-9172301M2A(54ACT163LMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
187 |
5962-9172301M2A(54ACT163LMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
188 |
5962-9172301M2A(54ACT163LMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
189 |
5962-9172301MEA |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
190 |
5962-9172301MEA(54ACT163DMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
191 |
5962-9172301MEA(54ACT163DMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
192 |
5962-9172301MEA(54ACT163DMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
193 |
5962-9172301MFA |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
194 |
5962-9172301MFA(54ACT163FMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
195 |
5962-9172301MFA(54ACT163FMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
196 |
5962-9172301MFA(54ACT163FMQB) |
4-Bit Binary Counter, Synchronous Reset |
National Semiconductor |
197 |
5962-9172501M3A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
198 |
5962-9172501MLA |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
199 |
5962-9172601M3A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
200 |
5962-9172601MLA |
Scan Test Devices With Octal Buffers |
Texas Instruments |
201 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
202 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
203 |
5962-9172801Q3A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
204 |
5962-9172801QLA |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
205 |
5962R9172201M2A |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
206 |
5962R9172201M2A(54ACT161LMQB-RH) |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
207 |
5962R9172201M2A(54ACT161LMQB-RH) |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
208 |
5962R9172201M2A(54ACT161LMQB-RH) |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
209 |
5962R9172201MEA |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
210 |
5962R9172201MEA(54ACT161DMQB-RH) |
4-Bit Binary Counter, Asynchronous Reset |
National Semiconductor |
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