No. |
Part Name |
Description |
Manufacturer |
181 |
AP130-36YR |
3.6 V; 300 mA low dropout (LDO) linear regulator |
Anachip |
182 |
AP130-36Z |
3.6 V; 300 mA low dropout (LDO) linear regulator |
Anachip |
183 |
AP130-36ZR |
3.6 V; 300 mA low dropout (LDO) linear regulator |
Anachip |
184 |
AQZ102D |
Power photoMOS relay (voltage sensitive type). DC type. Output rating: load voltage 60 V, load current 3.6 A. |
Matsushita Electric Works(Nais) |
185 |
AR2004LTS26 |
2600 V, 3180 A, 33.6 kA rectifier diode |
POSEICO SPA |
186 |
AS91L1001BU-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
187 |
AS91L1001BU-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
188 |
AS91L1001BU-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
189 |
AS91L1001BU-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
190 |
AS91L1001BU-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
191 |
AS91L1001BU-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
192 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
193 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
194 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
195 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
196 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
197 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
198 |
AS91L1001E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
199 |
AS91L1001E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
200 |
AS91L1001E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
201 |
AS91L1001E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
202 |
AS91L1001E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
203 |
AS91L1001E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
204 |
AS91L1001E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
205 |
AS91L1001E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
206 |
AS91L1001E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
207 |
AS91L1001E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
208 |
AS91L1001S-10F100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
209 |
AS91L1001S-10F100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
210 |
AS91L1001S-10F100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
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