| No. |
Part Name |
Description |
Manufacturer |
| 181 |
SNJ54BCT623FK |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 182 |
SNJ54BCT623J |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 183 |
SNJ54BCT623W |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 184 |
SNJ54BCT640FK |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 185 |
SNJ54BCT640J |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 186 |
SNJ54BCT640W |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 187 |
SNJ54BCT646FK |
Octal Bus Transceivers And Registers With 3-State Outputs |
Texas Instruments |
| 188 |
SNJ54BCT646JT |
Octal Bus Transceivers And Registers With 3-State Outputs |
Texas Instruments |
| 189 |
SNJ54BCT646W |
Octal Bus Transceivers And Registers With 3-State Outputs |
Texas Instruments |
| 190 |
SNJ54BCT652FK |
Octal Bus Transceivers And Registers With 3-State Outputs |
Texas Instruments |
| 191 |
SNJ54BCT652JT |
Octal Bus Transceivers And Registers With 3-State Outputs |
Texas Instruments |
| 192 |
SNJ54BCT652W |
Octal Bus Transceivers And Registers With 3-State Outputs |
Texas Instruments |
| 193 |
SNJ54BCT760FK |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 194 |
SNJ54BCT760J |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 195 |
SNJ54BCT760W |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 196 |
SNJ54BCT8240AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 197 |
SNJ54BCT8240AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 198 |
SNJ54BCT8244AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 199 |
SNJ54BCT8244AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 200 |
SNJ54BCT8245AFK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 201 |
SNJ54BCT8245AJT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 202 |
SNJ54BCT8373AFK |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 203 |
SNJ54BCT8373AJT |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 204 |
SNJ54BCT8374AFK |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 205 |
SNJ54BCT8374AJT |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 206 |
TMS320C6454BCTZ |
Fixed-Point Digital Signal Processor 697-FCBGA 0 to 90 |
Texas Instruments |
| 207 |
TMS320C6454BCTZ7 |
Fixed-Point Digital Signal Processor 697-FCBGA 0 to 0 |
Texas Instruments |
| 208 |
TMS320C6454BCTZ8 |
Fixed-Point Digital Signal Processor 697-FCBGA |
Texas Instruments |
| 209 |
TMS320C6454BCTZA |
Fixed-Point Digital Signal Processor 697-FCBGA -40 to 105 |
Texas Instruments |
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