| No. |
Part Name |
Description |
Manufacturer |
| 181 |
5962F9671101VYC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 182 |
5962F9672101VXC |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 183 |
5962F9672101VYC |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 184 |
74F418 |
32-Bit Memory Error Detection And Correction Circuit |
Fairchild Semiconductor |
| 185 |
74F630 |
16-Bit Error Detection and Correction Circuit With 3-State Outputs |
Fairchild Semiconductor |
| 186 |
74F632 |
32-Bit Parallel Error Detection and Correction Circuit |
Fairchild Semiconductor |
| 187 |
A701 |
A701: Test slide, various cancers plus corresponding normal |
etc |
| 188 |
ACS630D |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 189 |
ACS630HMSR |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 190 |
ACS630K |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 191 |
ACS630MS |
EDAC, Error Detection and Correction Circuit, Rad-Hard, Advanced Logic, CMOS |
Intersil |
| 192 |
ACTS630D |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 193 |
ACTS630HMSR |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 194 |
ACTS630K |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 195 |
ACTS630MS |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 196 |
AD9823 |
Correlated Double Sampler (CDS) |
Analog Devices |
| 197 |
AD9823BRUZ |
Correlated Double Sampler (CDS) |
Analog Devices |
| 198 |
AD9823KRUZ |
Correlated Double Sampler (CDS) |
Analog Devices |
| 199 |
ADP1047 |
Digital Power Factor Correction Controller with accurate AC Power Metering |
Analog Devices |
| 200 |
ADP1048 |
Digital Power Factor Correction Controller with accurate AC Power Metering |
Analog Devices |
| 201 |
AHA4011A-040PJC |
10 MBytes/sec reed-Solomon ERC (Error Correction Device) |
Advanced Hardware Architectures |
| 202 |
AHA4011B-040PJC |
10 MBytes/sec reed-Solomon ERC (Error Correction Device) |
Advanced Hardware Architectures |
| 203 |
AHA4011C |
10 MBytes/sec Reed-Solomon Error Correction Device |
Advanced Hardware Architectures |
| 204 |
AHA4012B |
1.5 MBytes/sec Reed-Solomon Error Correction Device |
Advanced Hardware Architectures |
| 205 |
AHA4012B-006 |
1.5 MBytes/sec Reed-Solomon Error Correction Device |
Advanced Hardware Architectures |
| 206 |
AHA4012B-006PJC |
1.5 MBytes/sec Reed-Solomon Error Correction Device |
Advanced Hardware Architectures |
| 207 |
AHA4012B-006PJI |
1.5 MBytes/sec Reed-Solomon Error Correction Device |
Advanced Hardware Architectures |
| 208 |
AHA4013B |
12.5 MBytes/sec Reed-Solomon Error Correction Device |
Advanced Hardware Architectures |
| 209 |
AHA4013B-050PJC |
12.5 MBytes/sec Reed-Solomon Error Correction Device |
Advanced Hardware Architectures |
| 210 |
AN1009 |
'NEGATIVE UNDERSHOOT' NVRAM DATA CORRUPTION |
SGS Thomson Microelectronics |
| | | |
