| No. |
Part Name |
Description |
Manufacturer |
| 181 |
HA-5320 |
Sample and Hold, 1s Acquisition Time, Precision |
Intersil |
| 182 |
HA-5330 |
Sample and Hold, 650ns Acquisiton Time, Precision |
Intersil |
| 183 |
HA5351 |
Sample and Hold, Low Supply Voltage, 64ns Acquisition Time |
Intersil |
| 184 |
HD46508 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
| 185 |
HD46508-1 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
| 186 |
HD46508-2 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
| 187 |
HD46508A |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
| 188 |
HD46508A-1 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
| 189 |
HD46508A-2 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
| 190 |
HM301D |
Diagnostic quality acquisition system for bio-electric sensors and bio-impedance measurements |
ST Microelectronics |
| 191 |
HM301DL |
Diagnostic quality acquisition system for bio-electric sensors and bio-impedance measurements |
ST Microelectronics |
| 192 |
LM12434 |
12-Bit Plus Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
| 193 |
LM12434CIV |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
| 194 |
LM12434CIWM |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
| 195 |
LM12438 |
12-Bit Plus Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
| 196 |
LM12438CIV |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
| 197 |
LM12438CIWM |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
| 198 |
LM12454 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| 199 |
LM12454CIV |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| 200 |
LM12458 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| 201 |
LM12458 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
Texas Instruments |
| 202 |
LM12458CIV |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| 203 |
LM12458CIV |
12-Bit Plus Sign Data Acquisition System with Self-Calibration 44-PLCC -40 to 85 |
Texas Instruments |
| 204 |
LM12458CIV/NOPB |
12-Bit Plus Sign Data Acquisition System with Self-Calibration 44-PLCC -40 to 85 |
Texas Instruments |
| 205 |
LM12458CIVF |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| 206 |
LM12458CIVX/NOPB |
12-Bit Plus Sign Data Acquisition System with Self-Calibration 44-PLCC -40 to 85 |
Texas Instruments |
| 207 |
LM12H454 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| 208 |
LM12H458 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| 209 |
LM12H458 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
Texas Instruments |
| 210 |
LM12H458CIV |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
| | | |
