| No. |
Part Name |
Description |
Manufacturer |
| 181 |
RHY11 |
Hall-effect device measuring axial magnetic field |
Siemens |
| 182 |
RHY17 |
Hall-effect device measuring magnetic field at low temperatures |
Siemens |
| 183 |
RHY18 |
Hall-effect device measuring magnetic field at low temperatures |
Siemens |
| 184 |
RHY18-S1 |
Hall-effect device measuring magnetic field at low temperatures |
Siemens |
| 185 |
RLD-78MC |
Laser Diodes > For Laser Printers, Sensoers > For Sensors and General Purpose Measuring Equipment |
ROHM |
| 186 |
SBV552 |
Hall-effect device measuring axial magnetic field |
Siemens |
| 187 |
SSN |
NTC Inrush Current Limiters Applications Include: Temperature Measurement, Temperature Control, Inrush Current Limiting, Temperature Compensation, Sensing Liquid or Air Flow |
Vishay |
| 188 |
T1 |
T1 Jitter Performance Measurement � AT&T Pub 62411 Certification |
Intel |
| 189 |
TB62802FG |
Clock driver for Linear CCD(EMI noise measures product) |
TOSHIBA |
| 190 |
THS788 |
Quad Channel Time Measurement Unit 100-HTQFP 0 to 70 |
Texas Instruments |
| 191 |
THS788PFD |
Quad Channel Time Measurement Unit 100-HTQFP 0 to 70 |
Texas Instruments |
| 192 |
THS788PFDT |
Quad Channel Time Measurement Unit 100-HTQFP 0 to 70 |
Texas Instruments |
| 193 |
THS789 |
Quad Channel Time Measurement Unit.. 100-HTQFP 0 to 70 |
Texas Instruments |
| 194 |
THS789PFD |
Quad Channel Time Measurement Unit.. 100-HTQFP 0 to 70 |
Texas Instruments |
| | | |
