| No. |
Part Name |
Description |
Manufacturer |
| 181 |
5962-8995001M2A(54ACT112LMQB) |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 182 |
5962-8995001M2A(54ACT112LMQB) |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 183 |
5962-8995001MEA |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 184 |
5962-8995001MEA(54ACT112DMQB) |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 185 |
5962-8995001MEA(54ACT112DMQB) |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 186 |
5962-8995001MFA |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 187 |
5962-8995001MFA(54ACT112FMQB) |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 188 |
5962-8995001MFA(54ACT112FMQB) |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 189 |
5962-8995001S2A |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 190 |
5962-8995001S2A |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 191 |
5962-8995001SEA |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 192 |
5962-8995001SEA |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 193 |
5962-8995001SFA |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 194 |
5962-8995001SFA |
Dual JK Negative Edge Triggered Flip-Flop |
National Semiconductor |
| 195 |
5962-9051601M2A |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 196 |
5962-9051601MRA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 197 |
5962-9051601MSA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 198 |
5962-9074701MRA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs 20-CDIP -55 to 125 |
Texas Instruments |
| 199 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 200 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 201 |
5962-9202501MXA |
16-Bit D-type Edge-Triggered Flip-Flops With 3-State Outputs |
Texas Instruments |
| 202 |
5962-9222203M2A |
Octal Edge-Triggered D-Type Flip-Flops with 3-State Outputs |
Texas Instruments |
| 203 |
5962-9222203MRA |
Octal Edge-Triggered D-Type Flip-Flops with 3-State Outputs |
Texas Instruments |
| 204 |
5962-9222205MRA |
Octal Edge-Triggered D-Type Flip-Flops with 3-State Outputs |
Texas Instruments |
| 205 |
5962-9314701Q2A |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 206 |
5962-9314701QRA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 207 |
5962-9314701QSA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 208 |
5962-9314801Q2A |
Octal Edge-Triggered D-type Flip-Flops With Clock Enable |
Texas Instruments |
| 209 |
5962-9314801QRA |
Octal Edge-Triggered D-type Flip-Flops With Clock Enable |
Texas Instruments |
| 210 |
5962-9314801QSA |
Octal Edge-Triggered D-type Flip-Flops With Clock Enable |
Texas Instruments |
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