No. |
Part Name |
Description |
Manufacturer |
181 |
EVAL-AD7716EB |
Evaluation Board For 22-Bit Data Acquisition System |
Analog Devices |
182 |
HA-2420 |
Sample and Hold Amplifiers, 3.2s Acquisition Time, JFET input |
Intersil |
183 |
HA-2425 |
Sample and Hold Amplifiers, 3.2s Acquisition Time, JFET input, Relaxed Spec |
Intersil |
184 |
HA-5320 |
Sample and Hold, 1s Acquisition Time, Precision |
Intersil |
185 |
HA-5330 |
Sample and Hold, 650ns Acquisiton Time, Precision |
Intersil |
186 |
HA5351 |
Sample and Hold, Low Supply Voltage, 64ns Acquisition Time |
Intersil |
187 |
HD46508 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
188 |
HD46508-1 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
189 |
HD46508-2 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
190 |
HD46508A |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
191 |
HD46508A-1 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
192 |
HD46508A-2 |
ADU(Analog Data Acquisition Unit) |
Hitachi Semiconductor |
193 |
HM301D |
Diagnostic quality acquisition system for bio-electric sensors and bio-impedance measurements |
ST Microelectronics |
194 |
HM301DL |
Diagnostic quality acquisition system for bio-electric sensors and bio-impedance measurements |
ST Microelectronics |
195 |
LM12434 |
12-Bit Plus Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
196 |
LM12434CIV |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
197 |
LM12434CIWM |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
198 |
LM12438 |
12-Bit Plus Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
199 |
LM12438CIV |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
200 |
LM12438CIWM |
Sign Data Acquisition System with Serial I/O and Self-Calibration |
National Semiconductor |
201 |
LM12454 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
202 |
LM12454CIV |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
203 |
LM12458 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
204 |
LM12458 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
Texas Instruments |
205 |
LM12458CIV |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
206 |
LM12458CIV |
12-Bit Plus Sign Data Acquisition System with Self-Calibration 44-PLCC -40 to 85 |
Texas Instruments |
207 |
LM12458CIV/NOPB |
12-Bit Plus Sign Data Acquisition System with Self-Calibration 44-PLCC -40 to 85 |
Texas Instruments |
208 |
LM12458CIVF |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
209 |
LM12458CIVX/NOPB |
12-Bit Plus Sign Data Acquisition System with Self-Calibration 44-PLCC -40 to 85 |
Texas Instruments |
210 |
LM12H454 |
12-Bit Plus Sign Data Acquisition System with Self-Calibration |
National Semiconductor |
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