| No. |
Part Name |
Description |
Manufacturer |
| 181 |
SNJ54ABT827JT |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 182 |
SNJ54ABT827W |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 183 |
SNJ54ABT841FK |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 184 |
SNJ54ABT841JT |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 185 |
SNJ54ABT841W |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 186 |
SNJ54ABT843FK |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 187 |
SNJ54ABT843JT |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 188 |
SNJ54ABT843W |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 189 |
SNJ54ABT853FK |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 190 |
SNJ54ABT853JT |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 191 |
SNJ54ABT853W |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 192 |
SNJ54ABT8543FK |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 193 |
SNJ54ABT8543JT |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 194 |
SNJ54ABT8646FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 195 |
SNJ54ABT8646JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 196 |
SNJ54ABT8652FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 197 |
SNJ54ABT8652JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 198 |
SNJ54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 199 |
SNJ54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 200 |
SNJ54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 201 |
SNJ54ABTE16245WD |
16-Bit Incident-Wave Switching Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 202 |
SNJ54ABTH16244WD |
16-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 203 |
SNJ54ABTH16245WD |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 204 |
SNJ54ABTH18502AHV |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
| 205 |
SNJ54ABTH18646AHV |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 206 |
SNJ54ABTH245FK |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 207 |
SNJ54ABTH245J |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 208 |
SNJ54ABTH245W |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 209 |
SNJ54ABTH32316HT |
16-Bit Tri-Port Universal Bus Exchangers |
Texas Instruments |
| 210 |
SNJ54AC00FK |
Quadruple 2-Input Positive-NAND Gates |
Texas Instruments |
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