No. |
Part Name |
Description |
Manufacturer |
181 |
FXL6408 |
Fully Configurable 8-Bit I2C-Controlled GPIO Expander |
Fairchild Semiconductor |
182 |
GFB7450-DP |
Dual expandable AND-OR-INVERT gates |
SESCOSEM |
183 |
GFB7453-DP |
Expandable 4x2 input AND-OR-INVERT gates |
SESCOSEM |
184 |
GFB7460-DP |
Dual four input expanders |
SESCOSEM |
185 |
GFC5450-DC |
Dual expandable AND-OR-INVERT gates |
SESCOSEM |
186 |
GFC5450-DP |
Dual expandable AND-OR-INVERT gates |
SESCOSEM |
187 |
GFC5450-FM |
Dual expandable AND-OR-INVERT gates |
SESCOSEM |
188 |
GFC5453-DC |
Expandable 4x2 input AND-OR-INVERT gates |
SESCOSEM |
189 |
GFC5453-DP |
Expandable 4x2 input AND-OR-INVERT gates |
SESCOSEM |
190 |
GFC5453-FM |
Expandable 4x2 input AND-OR-INVERT gates |
SESCOSEM |
191 |
GFC5460-DC |
Dual four input expanders |
SESCOSEM |
192 |
GFC5460-DP |
Dual four input expanders |
SESCOSEM |
193 |
GFC5460-FM |
Dual four input expanders |
SESCOSEM |
194 |
GL6551 |
COMPANDER |
Hynix Semiconductor |
195 |
GL6552 |
Low Voltage Compander |
Hynix Semiconductor |
196 |
H104 |
Expandable dual 4-input NAND |
SGS-ATES |
197 |
H104 |
Dual 4-input expandable NAND gate (active pull-up), standard temperature range |
SGS-ATES |
198 |
H104 |
Dual 4-input expandable NAND gate (active pull-up), intermediate temperature range |
SGS-ATES |
199 |
H104 |
Dual 4-input expandable NAND gate (active pull-up), extended temperature range |
SGS-ATES |
200 |
H105 |
Dual 2-wide 2-input expandable AND-NOR gate (active pull-up), standard temperature range |
SGS-ATES |
201 |
H105 |
Dual 2-wide 2-input expandable AND-NOR gate (active pull-up), intermediate temperature range |
SGS-ATES |
202 |
H105 |
Expandable dual 2-wide 2-input AND-OR-INVERT gate |
SGS-ATES |
203 |
H109 |
Expandable dual 4-input AND power |
SGS-ATES |
204 |
H109 |
Dual 4-input expandable power AND gate (open collector), standard temperature range |
SGS-ATES |
205 |
H109 |
Dual 4-input expandable power AND gate (open collector), intermediate temperature range |
SGS-ATES |
206 |
H109 |
Dual 4-input expandable power AND gate (open collector), extended temperature range |
SGS-ATES |
207 |
H113 |
Dual 2-input NAND gate plus dual expandable inverter (open-collector), standard temperature range |
SGS-ATES |
208 |
H113 |
Dual 2-input NAND gate plus dual expandable inverter (open-collector), intermediate temperature range |
SGS-ATES |
209 |
H113 |
Dual 2-input NAND gate plus dual expandable inverter (open-collector), extended temperature range |
SGS-ATES |
210 |
H124 |
Dual 4-input expandable NAND gate (passive pull-up), standard temperature range |
SGS-ATES |
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