No. |
Part Name |
Description |
Manufacturer |
19321 |
AS300LPB |
Shunt Temperature Sensor |
ASTEC Semiconductor |
19322 |
AS300LPT |
Shunt Temperature Sensor |
ASTEC Semiconductor |
19323 |
AS300VS13 |
Shunt Temperature Sensor |
ASTEC Semiconductor |
19324 |
AS300VS7 |
Shunt Temperature Sensor |
ASTEC Semiconductor |
19325 |
AS300VSA |
Shunt Temperature Sensor |
ASTEC Semiconductor |
19326 |
AS300VSB |
Shunt Temperature Sensor |
ASTEC Semiconductor |
19327 |
AS300VST |
Shunt Temperature Sensor |
ASTEC Semiconductor |
19328 |
AS3524 |
PASSIVATED ANISOTROPIC RECTIFIER TECHNOLOGY |
General Semiconductor |
19329 |
AS3528 |
PASSIVATED ANISOTROPIC RECTIFIER TECHNOLOGY |
General Semiconductor |
19330 |
AS431 |
Precision Tem-perature Compensated Reference IC |
ASTEC Semiconductor |
19331 |
AS91L1001BU-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19332 |
AS91L1001BU-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19333 |
AS91L1001BU-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19334 |
AS91L1001BU-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19335 |
AS91L1001BU-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19336 |
AS91L1001BU-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19337 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19338 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19339 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19340 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19341 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19342 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19343 |
AS91L1001E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19344 |
AS91L1001E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19345 |
AS91L1001E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19346 |
AS91L1001E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19347 |
AS91L1001E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19348 |
AS91L1001E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19349 |
AS91L1001E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19350 |
AS91L1001E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| | | |