No. |
Part Name |
Description |
Manufacturer |
1981 |
JV1N7058CCU3 |
30A 150V Hi-Rel Schottky Common Cathode Diode in a SMD-0.5 package DLA Number 1N7058CCU3 |
International Rectifier |
1982 |
K1615AC |
Miniature Selenium Diode, common cathode |
ITT Semiconductors |
1983 |
KCF16A20 |
KCF16A20, DUAL DIODES - CATHODE COMMON |
Nihon |
1984 |
KCF16A60 |
FRD DUAL DIODES CATHODE COMMON |
Nihon |
1985 |
L221 |
Power Schottky Rectifier with common cathode |
IXYS Corporation |
1986 |
L236 |
Common Cathode Fast Recovery Epitaxial Diode (FRED) |
IXYS Corporation |
1987 |
LBH1035 |
Soldering methods : IR reflow soldering |
etc |
1988 |
LM136AH-2.5-SMD |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
1989 |
LM136AH-2.5RQML |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
1990 |
LM136AH-2.5RQV |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
1991 |
LM136H |
2.5V REFERENCE DIODE/ GUARANTEED TO 100K RADSi TESTED TO MIL-STD-883/ METHOD 1019.5 |
National Semiconductor |
1992 |
LMH6628J-QML |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1993 |
LMH6628J-QMLV |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1994 |
LMH6628JFQML |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1995 |
LMH6628JFQMLV |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1996 |
LMH6628WG-QML |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1997 |
LMH6628WG-QMLV |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1998 |
LMH6628WGFQML |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
1999 |
LMH6628WGFQMLV |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
2000 |
LSGT677 |
Multi TOPLED Cathodes On One Side |
Siemens |
2001 |
LSGT677-HK |
Multi TOPLED Cathodes On One Side |
Siemens |
2002 |
LSGT677-J |
Multi TOPLED Cathodes On One Side |
Siemens |
2003 |
LSGT677-JL |
Multi TOPLED Cathodes On One Side |
Siemens |
2004 |
LSGT677-K |
Multi TOPLED Cathodes On One Side |
Siemens |
2005 |
LT022MC |
Low noise S/N:60db(according to measurement method Fig> 29-2) |
SHARP |
2006 |
LT022MD |
Low noise S/N:60db(according to measurement method Fig> 29-2) |
SHARP |
2007 |
LT022MF |
Low noise S/N:60db(according to measurement method Fig> 29-2) |
SHARP |
2008 |
LTC-637D1P |
COMMON CATHODE |
Lite-On Technology Corporation |
2009 |
LTP-3362G |
MULTIPLEX COMMON CATHODE |
Lite-On Technology Corporation |
2010 |
LTS-367HR |
COMMON CATHODE RT. HANDE DECIMAL |
Lite-On Technology Corporation |
| | | |