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Datasheets for HOD

Datasheets found :: 2701
Page: | 63 | 64 | 65 | 66 | 67 | 68 | 69 | 70 | 71 |
No. Part Name Description Manufacturer
1981 JV1N7058CCU3 30A 150V Hi-Rel Schottky Common Cathode Diode in a SMD-0.5 package DLA Number 1N7058CCU3 International Rectifier
1982 K1615AC Miniature Selenium Diode, common cathode ITT Semiconductors
1983 KCF16A20 KCF16A20, DUAL DIODES - CATHODE COMMON Nihon
1984 KCF16A60 FRD DUAL DIODES CATHODE COMMON Nihon
1985 L221 Power Schottky Rectifier with common cathode IXYS Corporation
1986 L236 Common Cathode Fast Recovery Epitaxial Diode (FRED) IXYS Corporation
1987 LBH1035 Soldering methods : IR reflow soldering etc
1988 LM136AH-2.5-SMD 2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 National Semiconductor
1989 LM136AH-2.5RQML 2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 National Semiconductor
1990 LM136AH-2.5RQV 2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 National Semiconductor
1991 LM136H 2.5V REFERENCE DIODE/ GUARANTEED TO 100K RADSi TESTED TO MIL-STD-883/ METHOD 1019.5 National Semiconductor
1992 LMH6628J-QML DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
1993 LMH6628J-QMLV DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
1994 LMH6628JFQML DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
1995 LMH6628JFQMLV DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
1996 LMH6628WG-QML DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
1997 LMH6628WG-QMLV DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
1998 LMH6628WGFQML DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
1999 LMH6628WGFQMLV DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 National Semiconductor
2000 LSGT677 Multi TOPLED Cathodes On One Side Siemens
2001 LSGT677-HK Multi TOPLED Cathodes On One Side Siemens
2002 LSGT677-J Multi TOPLED Cathodes On One Side Siemens
2003 LSGT677-JL Multi TOPLED Cathodes On One Side Siemens
2004 LSGT677-K Multi TOPLED Cathodes On One Side Siemens
2005 LT022MC Low noise S/N:60db(according to measurement method Fig> 29-2) SHARP
2006 LT022MD Low noise S/N:60db(according to measurement method Fig> 29-2) SHARP
2007 LT022MF Low noise S/N:60db(according to measurement method Fig> 29-2) SHARP
2008 LTC-637D1P COMMON CATHODE Lite-On Technology Corporation
2009 LTP-3362G MULTIPLEX COMMON CATHODE Lite-On Technology Corporation
2010 LTS-367HR COMMON CATHODE RT. HANDE DECIMAL Lite-On Technology Corporation


Datasheets found :: 2701
Page: | 63 | 64 | 65 | 66 | 67 | 68 | 69 | 70 | 71 |



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