No. |
Part Name |
Description |
Manufacturer |
211 |
MIC7453J |
1 AND-NOR gate, 4 x 2 AND inputs, expandable, ceramic housing |
ITT Semiconductors |
212 |
MIC7453N |
1 AND-NOR gate, 4 x 2 AND inputs, expandable, plastic housing |
ITT Semiconductors |
213 |
MIC7454 |
1 AND-NOR gate, 4 x 2 AND inputs |
ITT Semiconductors |
214 |
MIC7454J |
1 AND-NOR gate, 4 x 2 AND inputs, ceramic housing |
ITT Semiconductors |
215 |
MIC7454N |
1 AND-NOR gate, 4 x 2 AND inputs, plastic housing |
ITT Semiconductors |
216 |
MT9043 |
Dual reference frequency selectable, 3,3V Digital PLL with multiple clock outputs for T1/E1 and Stratum 4 and 4E applications |
Zarlink Semiconductor |
217 |
MT9044AP |
0.3-7.0V; T1/E1/OC3 system synchronizer. For synchronization and timing control for multitrunk T1, E1 and STS-3/OC3 systems, ST-BUS clock and frame pulse sources |
Mitel Semiconductor |
218 |
MT90840 |
512 X 2430 Channel Multiple Rate TDM ( 2, 4, 8 Mbps) to Parallel Port Distributed Hyperchannel Switch (DHS) for STS-1 and STS-3 Applications |
Zarlink Semiconductor |
219 |
NJU26108FR1 |
SRS CSII 5.1 AND TruSurround XT Decoder |
New Japan Radio |
220 |
PEF3452 |
Line Interface Unit for DS3, STS 1 and E3 |
Infineon |
221 |
QB-78K0KX1H |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
222 |
QB-78K0KX1H-T30MC |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
223 |
QB-78K0KX1H-T44GB |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
224 |
QB-78K0KX1H-T52GB |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
225 |
QB-78K0KX1H-T64GB |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
226 |
QB-78K0KX1H-T64GC |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
227 |
QB-78K0KX1H-T64GK |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
228 |
QB-78K0KX1H-T80GC |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
229 |
QB-78K0KX1H-T80GK |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
230 |
QB-78K0KX1H-ZZZ |
In-circuit emulator for 78K0/Kx1 and 78K0/Kx1+ |
NEC |
231 |
SCAN921260 |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
Texas Instruments |
232 |
SCAN921260UJB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
233 |
SCAN921260UJB/NOPB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
234 |
SCAN921260UJBX |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
235 |
SCAN926260 |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
236 |
SCAN926260 |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
Texas Instruments |
237 |
SCAN926260TUF |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
238 |
SCAN926260TUF |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
239 |
SCAN926260TUF/NOPB |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
240 |
SCAN926260TUFX |
3.0 V to 3.6 V, six 1 to 10 bus LVDS deserializer with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
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