No. |
Part Name |
Description |
Manufacturer |
211 |
EVAL-TMP05/06EB |
Complete Temperature Monitoring System |
Analog Devices |
212 |
FM51 |
Low Voltage High Drive Temperature Sensor |
Fairchild Semiconductor |
213 |
FM51S3 |
Low Voltage High Drive Temperature Sensor |
Fairchild Semiconductor |
214 |
FM75M8 |
Low-Voltage Digital I2C compatible Temp Sensor fro LM75 applications |
Fairchild Semiconductor |
215 |
FM75M8X |
Low-Voltage Digital I2C compatible Temp Sensor fro LM75 applications |
Fairchild Semiconductor |
216 |
FM75MM8 |
Low-Voltage Digital I2C compatible Temp Sensor fro LM75 applications |
Fairchild Semiconductor |
217 |
FM75MM8X |
Low-Voltage Digital I2C compatible Temp Sensor fro LM75 applications |
Fairchild Semiconductor |
218 |
G766 |
Remote Temperature Sensor with SMBus Serial Interface |
Global Mixed-mode Technology |
219 |
G768D |
Two temote temperature sensor and one fan controller with SMB serial interface and system reset circuit |
Global Mixed-mode Technology |
220 |
H102 |
Quad 2-input NAND gate (active pull-up), intermediate temperature range |
SGS-ATES |
221 |
H103 |
Triple 3-input NAND gate (active pull-up), intermediate temperature range |
SGS-ATES |
222 |
H104 |
Dual 4-input expandable NAND gate (active pull-up), intermediate temperature range |
SGS-ATES |
223 |
H105 |
Dual 2-wide 2-input expandable AND-NOR gate (active pull-up), intermediate temperature range |
SGS-ATES |
224 |
H109 |
Dual 4-input expandable power AND gate (open collector), intermediate temperature range |
SGS-ATES |
225 |
H110 |
Dual J-K flip-flop with set input, intermediate temperature range |
SGS-ATES |
226 |
H111 |
Dual J-K flip-flop with set and clear input, intermediate temperature range |
SGS-ATES |
227 |
H112 |
Hex inverter (open collector), intermediate temperature range |
SGS-ATES |
228 |
H113 |
Dual 2-input NAND gate plus dual expandable inverter (open-collector), intermediate temperature range |
SGS-ATES |
229 |
H114 |
Quad TTL to HLL-COS/MOS converter, intermediate temperature range |
SGS-ATES |
230 |
H115 |
Strobed hex inverter (open collector), intermediate temperature range |
SGS-ATES |
231 |
H118 |
Hex inverter (active pull-up), intermediate temperature range |
SGS-ATES |
232 |
H119 |
Strobed hex inverter (active pull-up), intermediate temperature range |
SGS-ATES |
233 |
H122 |
Quad 2-input NAND gate (passive pull-up), intermediate temperature range |
SGS-ATES |
234 |
H124 |
Dual 4-input expandable NAND gate (passive pull-up), intermediate temperature range |
SGS-ATES |
235 |
HM6264BI |
64k SRAM (8-kword x 8-bit) Wide Temperature Range version |
Hitachi Semiconductor |
236 |
HM6264BLFPI-10T |
64k SRAM (8-kword x 8-bit) Wide Temperature Range version |
Hitachi Semiconductor |
237 |
HM6264BLFPI-12T |
64k SRAM (8-kword x 8-bit) Wide Temperature Range version |
Hitachi Semiconductor |
238 |
HM6264BLPI-10 |
64k SRAM (8-kword x 8-bit) Wide Temperature Range version |
Hitachi Semiconductor |
239 |
HM6264BLPI-12 |
64k SRAM (8-kword x 8-bit) Wide Temperature Range version |
Hitachi Semiconductor |
240 |
HM628512CI |
Wide Temperature Range Version 4 M SRAM (512-kword x 8-bit) |
Hitachi Semiconductor |
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