| No. |
Part Name |
Description |
Manufacturer |
| 211 |
54QHSCT630FD |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 212 |
54QHSCT630FE |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 213 |
54QHSCT630FL |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 214 |
54QHSCT630FS |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 215 |
54RHSCT630CB |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 216 |
54RHSCT630CC |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 217 |
54RHSCT630CD |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 218 |
54RHSCT630CE |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 219 |
54RHSCT630CL |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 220 |
54RHSCT630CS |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 221 |
54RHSCT630FB |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 222 |
54RHSCT630FC |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 223 |
54RHSCT630FD |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 224 |
54RHSCT630FE |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 225 |
54RHSCT630FL |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 226 |
54RHSCT630FS |
Radiation hard 16-bit parallel error detection & correction |
Dynex Semiconductor |
| 227 |
5962F9671101VXC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 228 |
5962F9671101VYC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 229 |
5962F9672101VXC |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 230 |
5962F9672101VYC |
Radiation Hardened EDAC (Error Detection and Correction) |
Intersil |
| 231 |
61SV |
Infrared detector |
mble |
| 232 |
61SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 233 |
61SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 234 |
62SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 235 |
62SV |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 236 |
7109 |
Thermople Detectors for Rediation Measurements form UC to FAR IR |
Oriel |
| 237 |
7429 |
VOLTAGE DETECTOR |
Korea Electronics (KEC) |
| 238 |
74HC7046A |
Phase-locked-loop with lock detector |
Philips |
| 239 |
74HC7046AD |
Phase-locked-loop with lock detector |
NXP Semiconductors |
| 240 |
74HC7046AD |
74HC/HCT7046A; Phase-locked-loop with lock detector |
Philips |
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