| No. |
Part Name |
Description |
Manufacturer |
| 2131 |
SN54ABTH18502A |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
| 2132 |
SN54ABTH18502AHV |
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2133 |
SN54ABTH18504A |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2134 |
SN54ABTH18504AHV |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2135 |
SN54ABTH18646A |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 2136 |
SN54ABTH18646AHV |
SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 2137 |
SN54ABTH18652A |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 2138 |
SN54ABTH18652AHV |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 2139 |
SN54BCT8240A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 2140 |
SN54BCT8240AFK |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
| 2141 |
SN54BCT8240AJT |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
| 2142 |
SN54BCT8244A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 2143 |
SN54BCT8244AFK |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
| 2144 |
SN54BCT8244AJT |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
| 2145 |
SN54BCT8245A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 2146 |
SN54BCT8245AJT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
| 2147 |
SN54BCT8245ANT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
| 2148 |
SN54BCT8373A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 2149 |
SN54BCT8373AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 2150 |
SN54BCT8373AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 2151 |
SN54BCT8374A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 2152 |
SN54BCT8374AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 2153 |
SN54BCT8374AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 2154 |
SN54LVT182512 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2155 |
SN54LVT182512HKC |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2156 |
SN54LVT18502 |
3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2157 |
SN54LVT18502HV |
3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2158 |
SN54LVT18512 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2159 |
SN54LVT18512HKC |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 2160 |
SN54LVTH182502A |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| | | |
