No. |
Part Name |
Description |
Manufacturer |
2161 |
SN74LVT8996DWR |
3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver |
Texas Instruments |
2162 |
SN74LVT8996DWR |
3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver |
Texas Instruments |
2163 |
SN74LVT8996IPWREP |
Enhanced Product 3.3-V Abt 10-Bit Multidrop-Addressable Ieee Std 1149.1 Tap Transceiver 24-TSSOP -40 to 85 |
Texas Instruments |
2164 |
SN74LVT8996PW |
3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver |
Texas Instruments |
2165 |
SN74LVT8996PW |
3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver |
Texas Instruments |
2166 |
SN74LVT8996PWR |
3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver |
Texas Instruments |
2167 |
SN74LVT8996PWR |
3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver |
Texas Instruments |
2168 |
SN74SSQE32882 |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
2169 |
SN74SSQE32882ZALR |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
2170 |
SN74SSQE32882ZCJR |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test |
Texas Instruments |
2171 |
SN74SSQEA32882 |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test |
Texas Instruments |
2172 |
SN74SSQEA32882ZALR |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
2173 |
SN74SSQEB32882 |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
2174 |
SN74SSQEB32882ZALR |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
2175 |
SN74SSQEC32882 |
JEDEC SSTE32882 Compliant Low Power 28-Bit to 56-Bit Registered Buffer with Address-Parity Test |
Texas Instruments |
2176 |
SN74SSQEC32882ZALR |
JEDEC SSTE32882 Compliant Low Power 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
2177 |
SN74SSTEB32866 |
1.5V/1.8V 25-Bit Configurable Registered Buffer With Address-Parity Test 96-BGA -40 to 85 |
Texas Instruments |
2178 |
SN74SSTEB32866ZWLR |
1.5V/1.8V 25-Bit Configurable Registered Buffer With Address-Parity Test 96-BGA -40 to 85 |
Texas Instruments |
2179 |
SN74SSTU32866 |
25-Bit Configurable Registered Buffer With Address-Parity Test |
Texas Instruments |
2180 |
SN74SSTU32866GKER |
25-Bit Configurable Registered Buffer With Address-Parity Test |
Texas Instruments |
2181 |
SN74SSTU32866ZKER |
25-Bit Configurable Registered Buffer With Address-Parity Test |
Texas Instruments |
2182 |
SN74SSTUB32866 |
25-Bit Configurable Registered Buffer With Address-Parity Test |
Texas Instruments |
2183 |
SN74SSTUB32866ZKER |
25-Bit Configurable Registered Buffer With Address-Parity Test 96-LFBGA -40 to 85 |
Texas Instruments |
2184 |
SN74SSTUB32866ZWLR |
25-Bit Configurable Registered Buffer With Address-Parity Test 96-BGA -40 to 85 |
Texas Instruments |
2185 |
SNJ54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
2186 |
SNJ54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
2187 |
SNJ54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
2188 |
SNJ54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
2189 |
SNJ54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
2190 |
SNJ54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
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