No. |
Part Name |
Description |
Manufacturer |
241 |
93479ADC |
-0.5 V to +7 V, 256 x 9-bit static random access memory |
National Semiconductor |
242 |
93479ADMQB |
-0.5 V to +7 V, 256 x 9-bit static random access memory |
National Semiconductor |
243 |
93479ALMQB |
-0.5 V to +7 V, 256 x 9-bit static random access memory |
National Semiconductor |
244 |
93479DC |
-0.5 V to +7 V, 256 x 9-bit static random access memory |
National Semiconductor |
245 |
93479DMQB |
-0.5 V to +7 V, 256 x 9-bit static random access memory |
National Semiconductor |
246 |
93479LMQB |
-0.5 V to +7 V, 256 x 9-bit static random access memory |
National Semiconductor |
247 |
93L415ADC |
-0.5 V to +7 V, 1024 x 1-bit static random access memory |
National Semiconductor |
248 |
93L415APC |
-0.5 V to +7 V, 1024 x 1-bit static random access memory |
National Semiconductor |
249 |
93L422ADC |
-0.5 V to +7 V, 256 x 4-bit static random access memory |
National Semiconductor |
250 |
93L422APC |
-0.5 V to +7 V, 256 x 4-bit static random access memory |
National Semiconductor |
251 |
93L425ADC |
-0.5 V to +7 V, 1024 x 1-bit static random access memory |
National Semiconductor |
252 |
93L425APC |
-0.5 V to +7 V, 1024 x 1-bit static random access memory |
National Semiconductor |
253 |
9930 |
DTL integrated circuit, Dual 4-Input Extendable Gate, extended/standard temperature range |
SGS-ATES |
254 |
9932 |
DTL integrated circuit, Dual 4-Input Extendable Buffer, Extended/Standard temperature range |
SGS-ATES |
255 |
9933 |
DTL integrated circuit, Duap 4-Input Extender, Extended/Standard temperature range |
SGS-ATES |
256 |
9934 |
DTL integrated circuit, Dual 5-input gate, Standard temperature range |
SGS-ATES |
257 |
9935 |
DTL integrated circuit, Extendable Hex Inverter, Extended/Standard temperature range |
SGS-ATES |
258 |
9936 |
DTL integrated circuit, Hex Inverter, Extended/Standard temperature range |
SGS-ATES |
259 |
9944 |
DTL integrated circuit, Dual 4-Input Extendable Buffer, Extended/Standard temperature range |
SGS-ATES |
260 |
9945 |
DTL integrated circuit, Clocked Flip-Flops, Extended/Standard temperature range |
SGS-ATES |
261 |
9946 |
DTL integrated circuit, Quadruple 2-Input Gate, Extended/Standard temperature range |
SGS-ATES |
262 |
9948 |
DTL integrated circuit, Clocked Flip-Flops, Extended/Standard temperature range |
SGS-ATES |
263 |
9951 |
DTL integrated circuit, Monostable Multivibrator, Extended/Standard temperature range |
SGS-ATES |
264 |
9962 |
DTL integrated circuit, Triple 3-Input Gate, Extended/Standard temperature range |
SGS-ATES |
265 |
AB-001 |
INCREASING INA117 DIFFERENTIAL INPUT RANGE |
Burr Brown |
266 |
AB-013 |
INCREASING ADC603 INPUT RANGE |
Burr Brown |
267 |
AB-015 |
EXTENDING THE COMMON-MODE RANGE OF DIFFERENCE AMPLIFIERS |
Burr Brown |
268 |
AB-150 |
CREATING A BIPOLAR INPUT RANGE FOR THE DDC112 |
Burr Brown |
269 |
AB-178 |
CDAC ARCHITECTURE PLUS RESISTOR DIVIDER GIVES ADC574 PINOUT WITH SAMPLING, LOW POWER, NEW INPUT RANGES |
Burr Brown |
270 |
AD1385 |
16-Bit 500 kHz Wide Temperature Range Sampling ADC |
Analog Devices |
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