| No. |
Part Name |
Description |
Manufacturer |
| 241 |
5962-8853401EA(54ACT109DMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 242 |
5962-8853401FA |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 243 |
5962-8853401FA(54ACT109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 244 |
5962-8853401FA(54ACT109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 245 |
5962-8853401FA(54ACT109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 246 |
5962-89551012A |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 247 |
5962-89551012A(54AC109LMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 248 |
5962-89551012A(54AC109LMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 249 |
5962-8955101EA |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 250 |
5962-8955101EA(54AC109DMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 251 |
5962-8955101EA(54AC109DMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 252 |
5962-8955101FA |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 253 |
5962-8955101FA(54AC109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 254 |
5962-8955101FA(54AC109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 255 |
5962-89845022A |
Quadruple Positive-NAND Gates With Schmitt-trigger Inputs |
Texas Instruments |
| 256 |
5962-8984502DA |
Quadruple Positive-NAND Gates With Schmitt-trigger Inputs |
Texas Instruments |
| 257 |
5962-8984502VCA |
Quadruple Positive-NAND Gates With Schmitt-trigger Inputs |
Texas Instruments |
| 258 |
5962-8984502VDA |
Quadruple Positive-NAND Gates With Schmitt-trigger Inputs |
Texas Instruments |
| 259 |
5962-89945013A |
8-Bit D-type Edge-Triggered Read-Back Latches |
Texas Instruments |
| 260 |
5962-8994501KA |
8-Bit D-type Edge-Triggered Read-Back Latches |
Texas Instruments |
| 261 |
5962-8994501LA |
8-Bit D-type Edge-Triggered Read-Back Latches |
Texas Instruments |
| 262 |
5962-9051601M2A |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 263 |
5962-9051601MRA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 264 |
5962-9051601MSA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 265 |
5962-9074701MRA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs 20-CDIP -55 to 125 |
Texas Instruments |
| 266 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 267 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 268 |
5962-9202501MXA |
16-Bit D-type Edge-Triggered Flip-Flops With 3-State Outputs |
Texas Instruments |
| 269 |
5962-9218301M2A |
Hex Schmitt-trigger Inverters |
Texas Instruments |
| 270 |
5962-9218301MCA |
Hex Schmitt-trigger Inverters |
Texas Instruments |
| | | |
