No. |
Part Name |
Description |
Manufacturer |
241 |
SN74ABT8652DWR |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
242 |
SN74ABT8952 |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
243 |
SN74ABT8952DL |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
244 |
SN74ABT8952DLR |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
245 |
SN74ABT8952DW |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
246 |
SN74ABT8952DWR |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
247 |
SN74ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
248 |
SN74ABT8996DW |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
249 |
SN74ABT8996DWR |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
250 |
SN74ABT8996PW |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
251 |
SN74ABT8996PWLE |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
252 |
SN74ABT8996PWR |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
253 |
SNJ54ABT821FK |
10-Bit Bus Interface Flip-Flops With 3-State Outputs |
Texas Instruments |
254 |
SNJ54ABT821JT |
10-Bit Bus Interface Flip-Flops With 3-State Outputs |
Texas Instruments |
255 |
SNJ54ABT821W |
10-Bit Bus Interface Flip-Flops With 3-State Outputs |
Texas Instruments |
256 |
SNJ54ABT823FK |
9-Bit Bus-Interface Flip-Flops With 3-State Outputs |
Texas Instruments |
257 |
SNJ54ABT823JT |
9-Bit Bus-Interface Flip-Flops With 3-State Outputs |
Texas Instruments |
258 |
SNJ54ABT823W |
9-Bit Bus-Interface Flip-Flops With 3-State Outputs |
Texas Instruments |
259 |
SNJ54ABT8245FK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
260 |
SNJ54ABT8245JT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
261 |
SNJ54ABT827FK |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
262 |
SNJ54ABT827JT |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
263 |
SNJ54ABT827W |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
264 |
SNJ54ABT841FK |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
265 |
SNJ54ABT841JT |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
266 |
SNJ54ABT841W |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
267 |
SNJ54ABT843FK |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
268 |
SNJ54ABT843JT |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
269 |
SNJ54ABT843W |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
270 |
SNJ54ABT853FK |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
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