| No. |
Part Name |
Description |
Manufacturer |
| 241 |
SN54LVT8980JT |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
| 242 |
SN54LVT8986 |
3.3-V Linking Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) Tap Transceiver |
Texas Instruments |
| 243 |
SN54LVT8996 |
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
Texas Instruments |
| 244 |
SN54LVT8996FK |
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
Texas Instruments |
| 245 |
SN54LVT8996JT |
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
Texas Instruments |
| 246 |
SN74ACT8990 |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
| 247 |
SN74ACT8990FN |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
| 248 |
SN74ACT8990FNR |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
| 249 |
SN74ACT8994 |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
| 250 |
SN74ACT8994FN |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
| 251 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 252 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 253 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 254 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 255 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 256 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 257 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 258 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 259 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 260 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 261 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 262 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 263 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 264 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 265 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 266 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 267 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 268 |
SN74LVT8980 |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
| 269 |
SN74LVT8980A |
Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces |
Texas Instruments |
| 270 |
SN74LVT8980A-EP |
Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 |
Texas Instruments |
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