No. |
Part Name |
Description |
Manufacturer |
241 |
C8225-02 |
Pulse generator for NMOS linear image sensor driver circuit |
Hamamatsu Corporation |
242 |
CAT34TS02 |
Temperature Sensor with EEPROM Memory |
ON Semiconductor |
243 |
CAT34TS04 |
Digital Output Temperature Sensor with On-board SPD EEPROM |
ON Semiconductor |
244 |
CS1124 |
Dual Variable-Reluctance Sensor Interface IC |
ON Semiconductor |
245 |
CS1124-D |
Dual Variable-Reluctance Sensor Interface IC |
ON Semiconductor |
246 |
CS1124YD8 |
Dual Variable-Reluctance Sensor Interface IC |
ON Semiconductor |
247 |
CS1124YDR8 |
Dual Variable-Reluctance Sensor Interface IC |
ON Semiconductor |
248 |
CSEM2003D |
Capacitive sensor interface |
Xemics |
249 |
CXD1250M |
Example of Combination of Frame Readout System CCD Image Sensor and System IC |
SONY |
250 |
CXD1254AR |
Example of Combination of Frame Readout System CCD Image Sensor and System IC |
SONY |
251 |
DRV401AIDWP |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
252 |
DRV401AIDWPG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
253 |
DRV401AIDWPR |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
254 |
DRV401AIDWPRG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
255 |
DRV401AIRGWR |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
256 |
DRV401AIRGWRG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
257 |
DRV401AIRGWT |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
258 |
DRV401AIRGWTG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
259 |
DRV421 |
Closed-Loop, Current Sensing IC with Integrated Magnetic Fluxgate Sensor 20-QFN -40 to 125 |
Texas Instruments |
260 |
DRV421RTJR |
Closed-Loop, Current Sensing IC with Integrated Magnetic Fluxgate Sensor 20-QFN -40 to 125 |
Texas Instruments |
261 |
DRV421RTJT |
Closed-Loop, Current Sensing IC with Integrated Magnetic Fluxgate Sensor 20-QFN -40 to 125 |
Texas Instruments |
262 |
DS1701K |
1-Wire Temperature Sensor Evaluation Kit |
MAXIM - Dallas Semiconductor |
263 |
DS1703K |
3-Wire Temperature Sensor Evaluation Kit |
MAXIM - Dallas Semiconductor |
264 |
DS3501 |
High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT |
MAXIM - Dallas Semiconductor |
265 |
DS3501-JIG |
High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT |
MAXIM - Dallas Semiconductor |
266 |
DS3501K |
High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT |
MAXIM - Dallas Semiconductor |
267 |
DS3501U+ |
High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT |
MAXIM - Dallas Semiconductor |
268 |
DS3501U+H |
High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT |
MAXIM - Dallas Semiconductor |
269 |
DS3501U+T&R |
High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT |
MAXIM - Dallas Semiconductor |
270 |
DS3501U+T&R/C |
High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT |
MAXIM - Dallas Semiconductor |
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