No. |
Part Name |
Description |
Manufacturer |
241 |
SN74LVTH182652A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
242 |
SN74LVTH182652APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
243 |
SN74LVTH18502A |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
244 |
SN74LVTH18502A-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
245 |
SN74LVTH18502APM |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
246 |
SN74LVTH18502APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
247 |
SN74LVTH18502APMR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
248 |
SN74LVTH18512 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
249 |
SN74LVTH18512DGGR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
250 |
SN74LVTH18646A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
251 |
SN74LVTH18646A-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
252 |
SN74LVTH18646APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
253 |
SN74LVTH18646APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85 |
Texas Instruments |
254 |
SN74LVTH18652A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
255 |
SN74LVTH18652APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
256 |
SNJ54ABT18245AWD |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
257 |
SNJ54ABT18245WD |
Scan Test Device With 18-Bit Bus Transceivers 56-CFP -55 to 125 |
Texas Instruments |
258 |
SNJ54ABT18502HV |
Scan Test Device With 18-Bit Registered Bus Transceiver |
Texas Instruments |
259 |
SNJ54ABT18646HV |
Scan Test Devices With 18-Bit Bus Transceivers And Registers |
Texas Instruments |
260 |
SNJ54ABTH18502AHV |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
261 |
SNJ54ABTH18646AHV |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
262 |
SNJ54LVT18502HV |
3.3V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
263 |
SNJ54LVTH18502AHV |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
264 |
ST19NA18 |
ST19 8b secure MCU with 18KB EEPROM and Modular Arithmetic processor |
ST Microelectronics |
265 |
ST19WG34 |
Smartcard MCU With 18, 34, 66 Kbytes High Density EEPROM |
ST Microelectronics |
266 |
ST19WG66 |
Smartcard MCU With 18, 34, 66 Kbytes High Density EEPROM |
ST Microelectronics |
267 |
ST19WH18 |
Smartcard MCU With 18 Kbytes High Density EEPROM |
ST Microelectronics |
268 |
ST19WH18AW4084AA |
Smartcard MCU With 18 Kbytes High Density EEPROM |
ST Microelectronics |
269 |
ST19WM18 |
Smartcard MCU With 18, 34, 66 Kbytes High Density EEPROM |
ST Microelectronics |
270 |
ST19WM18AW4082AA |
Smartcard MCU With 18, 34, 66 Kbytes High Density EEPROM |
ST Microelectronics |
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