| No. |
Part Name |
Description |
Manufacturer |
| 241 |
CS5503-AS |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 242 |
CS5503-BP |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 243 |
CS5503-BS |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 244 |
CS5503-CP |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 245 |
CS5503-SD |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 246 |
CS5503-TD |
low-cost, 16 & 20-bit measurement A/D conveter |
Cirrus Logic |
| 247 |
DN |
NTC Thermistors, Applications Include: Temperature Measurement, Temperature Control, Inrush Current Limiting, Temperature Compensation, Sensing Liquid Level or Air Flow |
Vishay |
| 248 |
EA218 |
Hall-effect devices for measuring AC und DC magnetic fields |
Siemens |
| 249 |
EB38 |
Application Note - measuring the intermodulation distorsion of linear amplifiers |
Motorola |
| 250 |
EB38 |
MEASURING THE INTERMODULATION DISTORTION OF LINEAR AMPLIFIERS |
Motorola |
| 251 |
EMC1701-2 |
Current And Power Measurement ICs |
Microchip |
| 252 |
EMC1701-2-AIZL-TR |
Current And Power Measurement ICs |
Microchip |
| 253 |
EMC1704-2 |
Current And Power Measurement ICs |
Microchip |
| 254 |
EMC1704-2-AP-TR |
Current And Power Measurement ICs |
Microchip |
| 255 |
EVAL-AD5520EB |
Per-pin Parametric Measurement Unit / Source Measure Unit |
Analog Devices |
| 256 |
EVAL-AD5520EB |
Per-pin Parametric Measurement Unit / Source Measure Unit |
Analog Devices |
| 257 |
F2224-11 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 258 |
F2224-11M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 259 |
F2224-11P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 260 |
F2224-11S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 261 |
F2224-14 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 262 |
F2224-14M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 263 |
F2224-14P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 264 |
F2224-14S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 265 |
F2224-19 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 266 |
F2224-19M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 267 |
F2224-19P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 268 |
F2224-19S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 269 |
F2224-21 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 270 |
F2224-21M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
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