| No. |
Part Name |
Description |
Manufacturer |
| 241 |
SNJ54ABT8245JT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 242 |
SNJ54ABT827FK |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 243 |
SNJ54ABT827JT |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 244 |
SNJ54ABT827W |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 245 |
SNJ54ABT841FK |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 246 |
SNJ54ABT841JT |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 247 |
SNJ54ABT841W |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 248 |
SNJ54ABT843FK |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 249 |
SNJ54ABT843JT |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 250 |
SNJ54ABT843W |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 251 |
SNJ54ABT853FK |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 252 |
SNJ54ABT853JT |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 253 |
SNJ54ABT853W |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 254 |
SNJ54ABT8543FK |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 255 |
SNJ54ABT8543JT |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 256 |
SNJ54ABT8646FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 257 |
SNJ54ABT8646JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 258 |
SNJ54ABT8652FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 259 |
SNJ54ABT8652JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 260 |
SNJ54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 261 |
SNJ54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 262 |
SNJ54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 263 |
SNJ54ABTE16245WD |
16-Bit Incident-Wave Switching Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 264 |
SNJ54ABTH16244WD |
16-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 265 |
SNJ54ABTH16245WD |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 266 |
SNJ54ABTH18502AHV |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
| 267 |
SNJ54ABTH18646AHV |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 268 |
SNJ54ABTH245FK |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 269 |
SNJ54ABTH245J |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 270 |
SNJ54ABTH245W |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
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