No. |
Part Name |
Description |
Manufacturer |
2701 |
SN74LVTH182512-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2702 |
SN74LVTH182512DGGR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2703 |
SN74LVTH182646A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2704 |
SN74LVTH182646APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2705 |
SN74LVTH182652A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2706 |
SN74LVTH182652APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2707 |
SN74LVTH18502A |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2708 |
SN74LVTH18502A-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2709 |
SN74LVTH18502APM |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2710 |
SN74LVTH18502APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
2711 |
SN74LVTH18502APMR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2712 |
SN74LVTH18511 |
3.3-V ABT 18-BIT UNIVERSAL BUS TRANSCEIVER WITH BOUNDARY SCAN |
Texas Instruments |
2713 |
SN74LVTH18511DGGR |
3.3-V ABT 18-BIT UNIVERSAL BUS TRANSCEIVER WITH BOUNDARY SCAN |
Texas Instruments |
2714 |
SN74LVTH18512 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2715 |
SN74LVTH18512DGGR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2716 |
SN74LVTH18646A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2717 |
SN74LVTH18646A-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2718 |
SN74LVTH18646APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2719 |
SN74LVTH18646APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85 |
Texas Instruments |
2720 |
SN74LVTH18652A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2721 |
SN74LVTH18652APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2722 |
SNJ54ABT162601WD |
18-Bit Universal Bus Transceivers With 3-State Outputs |
Texas Instruments |
2723 |
SNJ54ABT16601WD |
18-Bit Universal Bus Transceivers With 3-State Outputs |
Texas Instruments |
2724 |
SNJ54ABT16823WD |
18-Bit Bus-Interface Flip-Flops With 3-State Outputs |
Texas Instruments |
2725 |
SNJ54ABT18245AWD |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
2726 |
SNJ54ABT18245WD |
Scan Test Device With 18-Bit Bus Transceivers 56-CFP -55 to 125 |
Texas Instruments |
2727 |
SNJ54ABT18502HV |
Scan Test Device With 18-Bit Registered Bus Transceiver |
Texas Instruments |
2728 |
SNJ54ABT18646HV |
Scan Test Devices With 18-Bit Bus Transceivers And Registers |
Texas Instruments |
2729 |
SNJ54ABTH18502AHV |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2730 |
SNJ54ABTH18646AHV |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
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