| No. |
Part Name |
Description |
Manufacturer |
| 271 |
F2224-21M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 272 |
F2224-21P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 273 |
F2224-21S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 274 |
F2224-24 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 275 |
F2224-24M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 276 |
F2224-24P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 277 |
F2224-24S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 278 |
F2224-29 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 279 |
F2224-29M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 280 |
F2224-29P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 281 |
F2224-29S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 282 |
F2224-31 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 283 |
F2224-31M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 284 |
F2224-31P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 285 |
F2224-31S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 286 |
F2224-34 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 287 |
F2224-34M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 288 |
F2224-34P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 289 |
F2224-34S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 290 |
F2224-39 |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 291 |
F2224-39M |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 292 |
F2224-39P |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 293 |
F2224-39S |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics |
Hamamatsu Corporation |
| 294 |
FA22e |
Hall-effect devices for measuring AC und DC magnetic fields |
Siemens |
| 295 |
FA24 |
Hall-effect devices for measuring AC und DC magnetic fields |
Siemens |
| 296 |
FC32 |
Hall-effect devices for measuring AC und DC magnetic fields |
Siemens |
| 297 |
FC33 |
Hall-effect devices for measuring AC und DC magnetic fields |
Siemens |
| 298 |
FC34 |
Hall-effect devices for measuring AC und DC magnetic fields |
Siemens |
| 299 |
FEDSM2000-11043 |
DUAL EMISSION LASER INDUCED FLUORESCENCE TECHNIQUE (DELIF) FOR OIL FILM THICKNESS AND TEMPERATURE MEASUREMENT |
etc |
| 300 |
GP2D02 |
Compact, High Sensitive Distance Measuring Sensor |
SHARP |
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