| No. |
Part Name |
Description |
Manufacturer |
| 271 |
HBC4055A |
7-segment decoder/driver |
SGS-ATES |
| 272 |
HBC4056A |
BCD-7-segment decoder/driver |
SGS-ATES |
| 273 |
HBC4704A |
BCD-7-segment decoder driver |
SGS-ATES |
| 274 |
HBF4055A |
7-segment decoder/driver |
SGS-ATES |
| 275 |
HBF4056A |
BCD-7-segment decoder/driver |
SGS-ATES |
| 276 |
HBF4704A |
BCD-7-segment decoder driver |
SGS-ATES |
| 277 |
HD74LS247 |
BCD to Seven Segment Decoders/Drivers |
Hitachi Semiconductor |
| 278 |
HD74LS247 |
BCD-to-Seven Segment Decode/Driver with 15V outputs |
Hitachi Semiconductor |
| 279 |
HD74LS248 |
BCD to Seven Segment Decoders/Drivers |
Hitachi Semiconductor |
| 280 |
HD74LS248 |
BCD-to-Seven Segment Decode/Driver with Internal Pull-up outputs |
Hitachi Semiconductor |
| 281 |
HD74LS249 |
BCD-to-Seven Segment Decode/Driver with Open Collector outputs |
Hitachi Semiconductor |
| 282 |
HD74LS249 |
BCD to Seven Segment Decoders/Drivers |
Hitachi Semiconductor |
| 283 |
HD74LS47 |
BCD-to-Seven Segment Decode/Driver with15V outputs |
Hitachi Semiconductor |
| 284 |
HD74LS47 |
BCD-to-Seven Segment Decoder Driver |
Hitachi Semiconductor |
| 285 |
HD74LS47P(DIP) |
BCD-to-Seven Segment Decoder Driver(with 15V outputs) |
Hitachi Semiconductor |
| 286 |
HD74LS48 |
BCD-to-Seven Segment Decode/Driver with Internal Pull-up outputs |
Hitachi Semiconductor |
| 287 |
HD74LS48 |
BCD-to-Seven Segment Decoder Driver |
Hitachi Semiconductor |
| 288 |
HD74LS49 |
BCD-to-Seven Segment Decode/Driver with Open Collector outputs |
Hitachi Semiconductor |
| 289 |
HD74LS49 |
BCD-to-Seven Segment Decoder Driver |
Hitachi Semiconductor |
| 290 |
HD74LS490P(DIP) |
BCD-to-Seven Segment Decoder Driver(with Open collector outputs) |
Hitachi Semiconductor |
| 291 |
HD74LS49FP(SMD) |
BCD-to-Seven Segment Decoder Driver(with Open collector outputs) |
Hitachi Semiconductor |
| 292 |
HSN-3000F |
Nuclear event detector |
Maxwell Technologies |
| 293 |
HSN-3000L |
Nuclear event detector |
Maxwell Technologies |
| 294 |
HSN-500F |
Nuclear event detector |
Maxwell Technologies |
| 295 |
HSN-500L |
Nuclear event detector |
Maxwell Technologies |
| 296 |
IL7101N |
EARTH LEAKAGE CURRENT DETECTOR |
INTEGRAL Semiconductor Devices |
| 297 |
IR2122 |
Single High Side Driver, Current Sensing, Overcurent Detection and Shutdown Fault Output in a 8-pin DIP package |
International Rectifier |
| 298 |
IR2127 |
Single High Side Driver, Noninverting Inputs, Current Sensing, Overcurent Detection and Shutdown Fault Output in a 8-pin DIP package |
International Rectifier |
| 299 |
IR21271 |
Single High Side Driver, Noninverting Inputs, Current Sensing, Overcurent Detection and Shutdown Fault Output in a 8-lead SOIC package |
International Rectifier |
| 300 |
IR21271S |
Single High Side Driver, Noninverting Inputs, Current Sensing, Overcurent Detection and Shutdown Fault Output in a 8-lead SOIC package |
International Rectifier |
| | | |
