No. |
Part Name |
Description |
Manufacturer |
271 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
272 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
273 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
274 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
275 |
SCAN921025SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
276 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
277 |
SCAN921224 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
278 |
SCAN921224 |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
279 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
280 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
281 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
282 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
283 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
284 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
285 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
286 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
287 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
288 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
289 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
290 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
291 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
292 |
SCAN921226SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
293 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
294 |
SP8401KGMPES |
Very Low Phase Noise 300MHz 10/11 |
Mitel Semiconductor |
295 |
TH7813ACC |
50 MHz 1024/2048 Linear CCDs |
Atmel |
296 |
TH7814ACC |
50 MHz 1024/2048 Linear CCDs |
Atmel |
297 |
TP2330 |
RF Power Transistor 30W 12.5V 175MHz 10dB |
TRW |
298 |
TP252 |
7.5 Volts Transistor 1.5W 400-512MHz 10dB Gain |
TRW |
299 |
TPS54A20 |
Small, 10MHz 10A, 8V to 14V Input, SWIFT Series Capacitor Step-Down Converter 20-VQFN-HR -40 to 125 |
Texas Instruments |
300 |
TPS54A20RNJR |
Small, 10MHz 10A, 8V to 14V Input, SWIFT Series Capacitor Step-Down Converter 20-VQFN-HR -40 to 125 |
Texas Instruments |
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