| No. |
Part Name |
Description |
Manufacturer |
| 271 |
2N918 |
NPN silicon annular transistor with high reliability designed for use in VHF and UHF amplifier, mixer and oscillator applications |
Motorola |
| 272 |
2N918ACSM |
Bipolar NPN Device in a Hermetically sealed LCC1 Ceramic Surface Mount Package for High Reliability Applications |
SemeLAB |
| 273 |
2N918CSM |
GENERAL PURPOSE, SMALL SIGNAL NPN TRANSISTOR IN A HERMETICALLY SEALED CERAMIC SURFACE MOUNT PACKAGE FOR HIGH RELIABILITY APPLICATIONS |
SemeLAB |
| 274 |
2N930CSM |
HIGH SPEED, MEDIUM POWER, NPN GENERAL PURPOSE TRANSISTOR IN A HERMETICALLY SEALED CERAMIC SURFACE MOUNT PACKAGE FOR HIGH RELIABILITY APPLICATIONS |
SemeLAB |
| 275 |
32TSOP |
PACKAGE RELIABILITY REPORT |
MAXIM - Dallas Semiconductor |
| 276 |
3N243 |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 277 |
3N243R |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 278 |
3N243TX |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 279 |
3N244 |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 280 |
3N244R |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 281 |
3N244TX |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 282 |
3N245 |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 283 |
3N245R |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 284 |
3N245TX |
High Reliability Opeically Coupled Isolators |
Optek Technology |
| 285 |
3N261 |
High reliability optically coupled isolator |
Optek Technology |
| 286 |
3N261TX |
High reliability optically coupled isolator |
Optek Technology |
| 287 |
3N262 |
High reliability optically coupled isolator |
Optek Technology |
| 288 |
3N262TX |
High reliability optically coupled isolator |
Optek Technology |
| 289 |
3N263 |
High reliability optically coupled isolator |
Optek Technology |
| 290 |
3N263TX |
High reliability optically coupled isolator |
Optek Technology |
| 291 |
45DB081B |
AT-45DB081B DATA FLASH RELIABILITY DATA |
Atmel |
| 292 |
5962-8777801XA |
Ultra Reliable Power Transistor |
National Semiconductor |
| 293 |
5962-8777801XA |
Ultra Reliable Power Transistor |
National Semiconductor |
| 294 |
5962-8777801XA |
Ultra Reliable Power Transistor |
National Semiconductor |
| 295 |
5962-8777801XA |
Ultra Reliable Power Transistor 3-TO -55 to 125 |
Texas Instruments |
| 296 |
5962-8777801YA |
Ultra Reliable Power Transistor |
National Semiconductor |
| 297 |
5962-8777801YA |
Ultra Reliable Power Transistor |
National Semiconductor |
| 298 |
5962-8777801YA |
Ultra Reliable Power Transistor |
National Semiconductor |
| 299 |
5962F9671701VRC |
High Reliability/ Radiation Hardened Octal Buffer/Line Driver/ Three-State |
Intersil |
| 300 |
5962F9671701VXC |
High Reliability/ Radiation Hardened Octal Buffer/Line Driver/ Three-State |
Intersil |
| | | |
