| No. |
Part Name |
Description |
Manufacturer |
| 271 |
NE57606CD |
2 to 4 cell redundant Lithium-ion overcharge monitor |
Philips |
| 272 |
NE57606DD |
2 to 4 cell redundant Lithium-ion overcharge monitor |
Philips |
| 273 |
NE57606ED |
2 to 4 cell redundant Lithium-ion overcharge monitor |
Philips |
| 274 |
NE57606YD |
2 to 4 cell redundant Lithium-ion overcharge monitor |
Philips |
| 275 |
NJU6360 |
High Drive Fundamental Quartz Crystal Oscillator |
New Japan Radio |
| 276 |
NJU6363 |
Low Operating Current Fundamental Quartz Crystal Oscillator |
New Japan Radio |
| 277 |
NJU6367 |
Fundamental Quartz Crystal Oscillator |
New Japan Radio |
| 278 |
NJU6368 |
High Drive Fundamental Quartz Crystal Oscillator |
New Japan Radio |
| 279 |
NJU6369 |
1.5V Operation Fundamental Quartz Crystal Oscillator |
New Japan Radio |
| 280 |
SCAN92LV090 |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN |
National Semiconductor |
| 281 |
SCAN92LV090 |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN |
Texas Instruments |
| 282 |
SCAN92LV090SLC |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN |
National Semiconductor |
| 283 |
SCAN92LV090SLC |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN 64-NFBGA -40 to 85 |
Texas Instruments |
| 284 |
SCAN92LV090SLC/NOPB |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN 64-NFBGA -40 to 85 |
Texas Instruments |
| 285 |
SCAN92LV090SLCX |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN |
National Semiconductor |
| 286 |
SCAN92LV090VEH |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN |
National Semiconductor |
| 287 |
SCAN92LV090VEH/NOPB |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN 64-LQFP -40 to 85 |
Texas Instruments |
| 288 |
SCAN92LV090VEHX |
9 Channel Bus LVDS Transceiver w/ Boundary SCAN |
National Semiconductor |
| 289 |
SCANPSC100F |
Embedded Boundary Scan Controller (IEEE 1149.1 Support) |
Fairchild Semiconductor |
| 290 |
SCANPSC100F |
Embedded Boundary Scan Controller |
National Semiconductor |
| 291 |
SCANPSC100FMW |
Embedded Boundary Scan Controller |
National Semiconductor |
| 292 |
SCANPSC100FSC |
Embedded Boundary Scan Controller |
Fairchild Semiconductor |
| 293 |
SCANPSC100FSCX |
Embedded Boundary Scan Controller |
Fairchild Semiconductor |
| 294 |
SCANSTA101ME |
Embedded Boundary Scan Controller |
National Semiconductor |
| 295 |
SCANSTA101W-QML |
Embedded Boundary Scan Controller |
National Semiconductor |
| 296 |
SG6741A |
Critical / Boundary Conduction Mode (CrCM / BCM) PFC Controllers |
Fairchild Semiconductor |
| 297 |
SN65HVD267 |
'Turbo' CAN Transceiver for CAN FD (Flexible Data Rate) with Redundancy 8-SOIC -40 to 125 |
Texas Instruments |
| 298 |
SN65HVD267D |
'Turbo' CAN Transceiver for CAN FD (Flexible Data Rate) with Redundancy 8-SOIC -40 to 125 |
Texas Instruments |
| 299 |
SN65HVD267DR |
'Turbo' CAN Transceiver for CAN FD (Flexible Data Rate) with Redundancy 8-SOIC -40 to 125 |
Texas Instruments |
| 300 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
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