No. |
Part Name |
Description |
Manufacturer |
3001 |
MN5211H_BCH |
12-bit military A/D converter |
Integrated Circuit Systems |
3002 |
MN5212 |
13?sec, 12-bit Military A/D Converters |
etc |
3003 |
MN5213 |
13?sec, 12-bit Military A/D Converters |
etc |
3004 |
MN5214 |
13?sec, 12-bit Military A/D Converters |
etc |
3005 |
MN5215 |
13?sec, 12-bit Military A/D Converters |
etc |
3006 |
MN5216 |
13?sec, 12-bit Military A/D Converters |
etc |
3007 |
MNDS26F32M-X-RH |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3008 |
MNDS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3009 |
MNDS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3010 |
MNDS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3011 |
MNDS26F32MJ/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3012 |
MNDS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3013 |
MNDS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3014 |
MNDS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3015 |
MNDS26F32MW/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3016 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3017 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3018 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3019 |
MNDS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3020 |
MNLM136A |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
3021 |
MNLM136A-2.5-X |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
3022 |
MNLM136A-2.5-X-RH |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
3023 |
MNLMH6628-X-RH |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
3024 |
MRCN |
Molded Sip, Molded Epoxy Case, Solderability per MIL-STD-202 Method 208E, Marking Resistance to Solvents per MIL-STD-202 Method 215 |
Vishay |
3025 |
MRCN |
Molded Sip, Molded Epoxy Case, Solderability per MIL-STD-202 Method 208E, Marking Resistance to Solvents per MIL-STD-202 Method 215 |
Vishay |
3026 |
MRD100 |
40 Volt MICRO-T Photo Transistor NPN Silicon 50 milliwatts |
Motorola |
3027 |
MRD150 |
40 Volt MICRO-T Photo Transistor NPN Silicon 50 milliwatts |
Motorola |
3028 |
MRD450 |
40 Volt Plastic NPN Silicon Photo Transistor 100 milliwatts |
Motorola |
3029 |
MRD600 |
50 Volt NPN Silicon Photo Detector 50 milliwatts |
Motorola |
3030 |
MRLM111 |
Total supply voltage: 36V; negative V.: -30V; positiveV: +30V; voltage comparator: also available guaranteed to 30k rd (Si) tested to MIL-STD-883, method 1019 |
National Semiconductor |
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