No. |
Part Name |
Description |
Manufacturer |
3001 |
MN5206H/BCH |
50Usec, 12-bit Military A/D Converters |
Integrated Circuit Systems |
3002 |
MN5210 |
13?sec, 12-bit Military A/D Converters |
etc |
3003 |
MN5210 |
12-bit military A/D converter |
Integrated Circuit Systems |
3004 |
MN5210H |
12-bit military A/D converter |
Integrated Circuit Systems |
3005 |
MN5210H_B |
12-bit military A/D converter |
Integrated Circuit Systems |
3006 |
MN5210H_BCH |
12-bit military A/D converter |
Integrated Circuit Systems |
3007 |
MN5211 |
13?sec, 12-bit Military A/D Converters |
etc |
3008 |
MN5211 |
12-bit military A/D converter |
Integrated Circuit Systems |
3009 |
MN5211H |
12-bit military A/D converter |
Integrated Circuit Systems |
3010 |
MN5211H_B |
12-bit military A/D converter |
Integrated Circuit Systems |
3011 |
MN5211H_BCH |
12-bit military A/D converter |
Integrated Circuit Systems |
3012 |
MN5212 |
13?sec, 12-bit Military A/D Converters |
etc |
3013 |
MN5213 |
13?sec, 12-bit Military A/D Converters |
etc |
3014 |
MN5214 |
13?sec, 12-bit Military A/D Converters |
etc |
3015 |
MN5215 |
13?sec, 12-bit Military A/D Converters |
etc |
3016 |
MN5216 |
13?sec, 12-bit Military A/D Converters |
etc |
3017 |
MNDS26F32M-X-RH |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3018 |
MNDS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3019 |
MNDS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3020 |
MNDS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3021 |
MNDS26F32MJ/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3022 |
MNDS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3023 |
MNDS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3024 |
MNDS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3025 |
MNDS26F32MW/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3026 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3027 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3028 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3029 |
MNDS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
3030 |
MNLM136A |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
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