No. |
Part Name |
Description |
Manufacturer |
301 |
NX8504CE-CC |
1550 nm InGaAsP MQW DFB laser diode for 622 Mb/s application. With SC-PC connector. Vertical mount flange. |
NEC |
302 |
OM8504SC |
Hi-Rel Adjustable 1.2V-3.2V Linear Regulator in a MO-078AA Package |
International Rectifier |
303 |
OM8504SF |
Hi-Rel Adjustable 1.2V-3.2V Linear Regulator in a 8-Pin FLAT-PAK Package |
International Rectifier |
304 |
PCS3I8504A |
General Purpose Peak EMI Reduction IC |
ON Semiconductor |
305 |
RFFM8504 |
5 GHz 802.11a/n/ac Wi-Fi Front End Module |
Qorvo |
306 |
SI-8504L |
Separate Excitation Switching Type with Coil |
Sanken |
307 |
SI-8504LE |
Switching Regulator IC with Coil |
Sanken |
308 |
SM8504 |
8-Bit Single Chip Microcomputer |
SHARP |
309 |
SN54ABT18504 |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
310 |
SN54ABT18504HV |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
311 |
SN54ABTH18504A |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
312 |
SN54ABTH18504AHV |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
313 |
SN54LVTH18504A |
3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
314 |
SN54LVTH18504AHV |
3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
315 |
SN74ABT18504 |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
316 |
SN74ABT18504PM |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
317 |
SN74ABT18504PMG4 |
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
318 |
SN74ABT18504PMR |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
319 |
SN74ABTH18504A |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
320 |
SN74ABTH18504APM |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
321 |
SN74ABTH18504APMR |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
322 |
SN74LVT18504 |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
323 |
SN74LVT18504PM |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
324 |
SN74LVTH18504A |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
325 |
SN74LVTH18504APM |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
326 |
SN74LVTH18504APMG4 |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
327 |
SN74LVTH18504APMR |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
328 |
TA8504 |
HIGH SPEED COMPARATOR |
TOSHIBA |
329 |
TA8504F |
High Speed Comparator |
TOSHIBA |
330 |
TPCP8504 |
Power transistor for high-speed switching applications |
TOSHIBA |
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