No. |
Part Name |
Description |
Manufacturer |
301 |
SCAN90CP02SP/NOPB |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 28-UQFN -40 to 85 |
Texas Instruments |
302 |
SCAN90CP02SPX |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 |
National Semiconductor |
303 |
SCAN90CP02VY |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 |
National Semiconductor |
304 |
SCAN90CP02VY/NOPB |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 32-LQFP -40 to 85 |
Texas Instruments |
305 |
SCAN90CP02VYX |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 |
National Semiconductor |
306 |
SCAN921023 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
307 |
SCAN921023 |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
308 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
309 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
310 |
SCAN921023SLC/NOPB |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
311 |
SCAN921023SLCX |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
312 |
SCAN921025 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
313 |
SCAN921025 |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
314 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
315 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
316 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
317 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
318 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
319 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
320 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
321 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
322 |
SCAN921025SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
323 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
324 |
SCAN921224 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
325 |
SCAN921224 |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
326 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
327 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
328 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
329 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
330 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
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