| No. |
Part Name |
Description |
Manufacturer |
| 301 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 302 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 303 |
5962-9172801Q3A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 304 |
5962-9172801QLA |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 305 |
5962-9174601Q3A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 306 |
5962-9174601QLA |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 307 |
5962-9318601M3A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 308 |
5962-9318601MLA |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 309 |
5962-9323901Q3A |
Scan Path Linkers With 4-Bit Identification Buses |
Texas Instruments |
| 310 |
5962-9323901QXA |
Scan Path Linkers With 4-Bit Identification Buses |
Texas Instruments |
| 311 |
5962-9458601Q3A |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 312 |
5962-9458601QXA |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 313 |
5962-9460102QXA |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
| 314 |
5962-9461501Q3A |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 315 |
5962-9461501QXA |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 316 |
5962-9461601Q3A |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 317 |
5962-9461601QXA |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 318 |
5962-9467201QXA |
Scan Test Device With 18-Bit Registered Bus Transceiver |
Texas Instruments |
| 319 |
5962-9469801QXA |
Scan Test Devices With 18-Bit Bus Transceivers And Registers |
Texas Instruments |
| 320 |
5962-9475001Q3A |
Embedded Boundary Scan Controller |
National Semiconductor |
| 321 |
5962-9475001QXA |
Embedded Boundary Scan Controller |
National Semiconductor |
| 322 |
5962-9475001QYA |
Embedded Boundary Scan Controller |
National Semiconductor |
| 323 |
5962-9561401QXA |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
| 324 |
5962-9669801QXA |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 325 |
5962-9681101QXA |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
| 326 |
5962-9681201Q3A |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 327 |
5962-9681201QKA |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 328 |
5962-9681201QLA |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 329 |
5962-9682701Q3A |
DIAGNOSTIC SCAN REGISTER |
Texas Instruments |
| 330 |
5962-9682701QLA |
DIAGNOSTIC SCAN REGISTER |
Texas Instruments |
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