No. |
Part Name |
Description |
Manufacturer |
301 |
AS91L1006E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
302 |
AS91L1006E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
303 |
AS91L1006E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
304 |
AS91L1006E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
305 |
AS91L1006E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
306 |
AS91L1006S-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
307 |
AS91L1006S-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
308 |
AS91L1006S-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
309 |
AS91L1006S-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
310 |
AS91L1006S-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
311 |
AS91L1006S-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
312 |
AS91L1006S-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
313 |
AS91L1006S-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
314 |
AS91L1006S-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
315 |
AS91L1006S-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
316 |
AS91L1006S-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
317 |
AS91L1006S-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
318 |
AS91L1006U-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
319 |
AS91L1006U-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
320 |
AS91L1006U-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
321 |
AS91L1006U-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
322 |
AS91L1006U-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
323 |
AS91L1006U-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
324 |
AS91L1006U-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
325 |
AS91L1006U-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
326 |
AS91L1006U-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
327 |
AS91L1006U-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
328 |
AS91L1006U-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
329 |
AS91L1006U-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
330 |
EPS448 |
SAM EPLD / Stand-Alone Microsequencer |
Altera Corporation |
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