| No. |
Part Name |
Description |
Manufacturer |
| 301 |
SN54ABT8652 |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 302 |
SN54ABT8652FK |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 303 |
SN54ABT8652JT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 304 |
SN54ABT8952 |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
| 305 |
SN54ABT8952FK |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
| 306 |
SN54ABT8952JT |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
| 307 |
SN54ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 308 |
SN54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 309 |
SN54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 310 |
SN54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP |
Texas Instruments |
| 311 |
SN54ABTE16245 |
16-Bit Incident-Wave Switching Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 312 |
SN54ABTE16245WD |
16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 313 |
SN54ABTE16246 |
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS |
Texas Instruments |
| 314 |
SN54ABTE16246WD |
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS |
Texas Instruments |
| 315 |
SN54ABTH162245 |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 316 |
SN54ABTH162245WD |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 317 |
SN54ABTH162260 |
12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS |
Texas Instruments |
| 318 |
SN54ABTH162260WD |
12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS |
Texas Instruments |
| 319 |
SN54ABTH16244 |
16-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 320 |
SN54ABTH16244WD |
16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 321 |
SN54ABTH16245 |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 322 |
SN54ABTH16245WD |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 323 |
SN54ABTH162460 |
4-TO-1 MULTIPLEXED/DEMULTIPLEXED REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 324 |
SN54ABTH162460WD |
4-TO-1 MULTIPLEXED/DEMULTIPLEXED REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 325 |
SN54ABTH16460 |
4-TO-1 MULTIPLEXED/DEMULTIPLEXED TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 326 |
SN54ABTH16460WD |
4-TO-1 MULTIPLEXED/DEMULTIPLEXED TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 327 |
SN54ABTH16823 |
18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 328 |
SN54ABTH16823WD |
18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 329 |
SN54ABTH182502A |
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 330 |
SN54ABTH182502AHV |
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
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