No. |
Part Name |
Description |
Manufacturer |
3031 |
AQZ105 |
Power photoMOS relay, 1-channel (form A). DC type. Output rating: load voltage 100 V, load current 2.6 A. |
Matsushita Electric Works(Nais) |
3032 |
AR2004LTS26 |
2600 V, 3180 A, 33.6 kA rectifier diode |
POSEICO SPA |
3033 |
AR371S34 |
3400 V, 920 A, 5.6 kA rectifier diode |
POSEICO SPA |
3034 |
ARE1303 |
RE-relay. 2.6 GHz 75 ohm relays for broadcasting industry. Standard PC board terminal. Nominal voltage 3 V DC. |
Matsushita Electric Works(Nais) |
3035 |
ARE1306 |
RE-relay. 2.6 GHz 75 ohm relays for broadcasting industry. Standard PC board terminal. Nominal voltage 6 V DC. |
Matsushita Electric Works(Nais) |
3036 |
ARE1309 |
RE-relay. 2.6 GHz 75 ohm relays for broadcasting industry. Standard PC board terminal. Nominal voltage 9 V DC. |
Matsushita Electric Works(Nais) |
3037 |
ARE1312 |
RE-relay. 2.6 GHz 75 ohm relays for broadcasting industry. Standard PC board terminal. Nominal voltage 12 V DC. |
Matsushita Electric Works(Nais) |
3038 |
ARE1324 |
RE-relay. 2.6 GHz 75 ohm relays for broadcasting industry. Standard PC board terminal. Nominal voltage 24 V DC. |
Matsushita Electric Works(Nais) |
3039 |
ARE134H |
RE-relay. 2.6 GHz 75 ohm relays for broadcasting industry. Standard PC board terminal. Nominal voltage 4.5 V DC. |
Matsushita Electric Works(Nais) |
3040 |
AS91L1001BU-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3041 |
AS91L1001BU-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3042 |
AS91L1001BU-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3043 |
AS91L1001BU-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3044 |
AS91L1001BU-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3045 |
AS91L1001BU-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3046 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3047 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3048 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3049 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3050 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3051 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3052 |
AS91L1001E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3053 |
AS91L1001E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3054 |
AS91L1001E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3055 |
AS91L1001E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3056 |
AS91L1001E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3057 |
AS91L1001E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3058 |
AS91L1001E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3059 |
AS91L1001E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3060 |
AS91L1001E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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