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Datasheets for 4BCT8

Datasheets found :: 54
Page: | 1 | 2 |
No. Part Name Description Manufacturer
31 SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches Texas Instruments
32 SN74BCT8373ADW IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches Texas Instruments
33 SN74BCT8373ADWR IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches Texas Instruments
34 SN74BCT8373ANT IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches Texas Instruments
35 SN74BCT8373DW Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Texas Instruments
36 SN74BCT8373DWR Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Texas Instruments
37 SN74BCT8373NT Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 Texas Instruments
38 SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops Texas Instruments
39 SN74BCT8374ADW Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops Texas Instruments
40 SN74BCT8374ADWR Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops Texas Instruments
41 SN74BCT8374ANT Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops Texas Instruments
42 SN74BCT899 9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70 Texas Instruments
43 SN74BCT899DW 9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70 Texas Instruments
44 SN74BCT899DWR 9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70 Texas Instruments
45 SNJ54BCT8240AFK Scan Test Devices With Octal Buffers Texas Instruments
46 SNJ54BCT8240AJT Scan Test Devices With Octal Buffers Texas Instruments
47 SNJ54BCT8244AFK Scan Test Devices With Octal Buffers Texas Instruments
48 SNJ54BCT8244AJT Scan Test Devices With Octal Buffers Texas Instruments
49 SNJ54BCT8245AFK Scan Test Devices With Octal Bus Transceivers Texas Instruments
50 SNJ54BCT8245AJT Scan Test Devices With Octal Bus Transceivers Texas Instruments
51 SNJ54BCT8373AFK Scan Test Devices With Octal D-type Latches Texas Instruments
52 SNJ54BCT8373AJT Scan Test Devices With Octal D-type Latches Texas Instruments
53 SNJ54BCT8374AFK Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops Texas Instruments
54 SNJ54BCT8374AJT Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops Texas Instruments


Datasheets found :: 54
Page: | 1 | 2 |



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